Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12154780 | Mass spectrometer using unitary insert between first and second ion traps | Alexander A. Makarov, Wilko Balschun, Aivaras Venckus, Denis Chernyshev, Eduard V. Denisov | 2024-11-26 |
| 12002671 | Electrode arrangement | Alexander A. Makarov, Wilko Balschun, Denis Chernyshev, Eduard V. Denisov | 2024-06-04 |
| 11961729 | Longitudinal tool for cleaning ion optic multipole devices | Amelia Corinne Peterson, Aivaras Venckus | 2024-04-16 |
| 11430646 | Atmospheric pressure ion source interface | Aivaras Venckus, Hamish Stewart, Christian Hock | 2022-08-30 |
| 11387093 | Electrode arrangement | Alexander A. Makarov, Wilko Balschun, Denis Chernyshev, Eduard V. Denisov | 2022-07-12 |
| 11087969 | Charge detection for ION current control | Amelia Corinne Peterson, Alexander Kholomeev, Alexander A. Makarov | 2021-08-10 |
| 11062895 | Mass spectrometer having improved quadrupole robustness | Amelia Corinne Peterson, Oliver Lange, Alexander A. Makarov | 2021-07-13 |
| 10811243 | Ion supply system and method to control an ion supply system | Amelia Corinne Peterson, Denis Chernyshev, Erik COUZIJN | 2020-10-20 |
| 9870906 | Multipole PCB with small robotically installed rod segments | Scott T. Quarmby, James M. Hitchcock | 2018-01-16 |
| 9698002 | Method and apparatus for mass analysis utilizing ion charge feedback | Oliver Lange, Ulf Fröhlich, Andreas Wieghaus, Alexander Kholomeev, Alexander A. Makarov | 2017-07-04 |
| 9543131 | Method of operating a mass filter in mass spectrometry | Andreas Kuehn, Dirk Nolting, Oliver Lange, Eugen Damoc | 2017-01-10 |
| 9536722 | Ion guide | Dmitry Grinfeld, Wilko Balschun, Eduard V. Denisov, Alexander A. Makarov | 2017-01-03 |
| 9460905 | Method of assessing vacuum conditions in a mass spectrometer with transient signal decay rates | Konstantin AIZIKOV, Dirk Nolting | 2016-10-04 |
| 9324547 | Method and apparatus for mass analysis utilizing ion charge feedback | Oliver Lange, Ulf Froehlich, Andreas Wieghaus, Alexander Kholomeev, Alexander A. Makarov | 2016-04-26 |
| 9007784 | Device for self-aligning and affixing of a microchannel plate in a micro-system and method the same | Eric Wapelhorst, Jörg Müller | 2015-04-14 |
| 8841604 | Mass analyser | Eduard V. Denisov, Alexander Kholomeev, Alexander A. Makarov | 2014-09-23 |
| 8134120 | Mass spectrometer | Joerg Mueller, Eric Wapelhorst | 2012-03-13 |
| 7834975 | Method and exposure apparatus for performing a tilted focus and a device manufactured accordingly | Jacobus Burghoorn, Arie Jeffrey Den Boef, Martinus Hendrikus Antonius Leenders, Uwe Mickan, Roeland Nicolaas Maria Vanneer | 2010-11-16 |
| 7518706 | Exposure apparatus, a tilting device method for performing a tilted focus test, and a device manufactured accordingly | Arie Jeffrey Den Boef, Martinus Hendrikus Antonius Leenders, Uwe Mickan, Roeland Nicolaas Maria Vanneer, Jacobus Burghoorn | 2009-04-14 |
| 7502097 | Method and exposure apparatus for performing a tilted focus and a device manufactured accordingly | — | 2009-03-10 |
| 7502096 | Lithographic apparatus, calibration method, device manufacturing method and computer program product | Jeffrey Godefridus Cornelis Tempelaars, Gerardus Carolus Johannus Hofmans, Rene Oesterholt, Hans Erik KATTOUW | 2009-03-10 |
| 7355675 | Method for measuring information about a substrate, and a substrate for use in a lithographic apparatus | Sanjay Lalbahadoersing, Marco Johannes Annemarie Pieters, Coen Van De Vin | 2008-04-08 |
| 7298455 | Lithographic apparatus and device manufacturing method | Arnold Sinke | 2007-11-20 |
| 7209214 | Lithographic apparatus focus test method and system, and device manufacturing method | Marco Johannes Annemarie Pieters, Coen Van De Vin | 2007-04-24 |