| 12416663 |
Embedded system to characterize BTI degradation effects in MOSFETs |
Michele Quarantelli, Alberto Piadena, Tomasz Brozek, Christopher Hess, Larg Weiland |
2025-09-16 |
| 10852337 |
Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies |
Tomasz Brozek, Yuan Yu, Mike Kyu Hyon Pak, Meindert Martin Lunenborg |
2020-12-01 |
| 10641804 |
Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistors |
— |
2020-05-05 |
| 10529631 |
Test structures and method for electrical measurement of FinFET fin height |
Jianjun Cheng, Yuan Yu |
2020-01-07 |
| 9952268 |
Method for accurate measurement of leaky capacitors using charge based capacitance measurements |
Yuan Yu |
2018-04-24 |
| 9691669 |
Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies |
Thomas Brozek, Yuan Yu, Mike Kyu Hyon Pak, Meindert Martin Lunenborg |
2017-06-27 |
| 7932105 |
Systems and methods for detecting and monitoring nickel-silicide process and induced failures |
Jae-Yong Park, Benjamin Shieh, Mark A. Spinelli, Sr., Shiying Xiong, Hossein Karbasi |
2011-04-26 |
| 7644388 |
Method for reducing layout printability effects on semiconductor device performance |
Lidia Daldoss, Christoph Dolainsky, Rakesh Vallishayee |
2010-01-05 |
| 7047505 |
Method for optimizing the characteristics of integrated circuits components from circuit specifications |
Andrei Shibkov, Patrick D. McNamara, Carlo Guardiani |
2006-05-16 |
| 7003742 |
Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded cores |
Patrick D. McNamara, Carlo Guardiani, Lidia Daldoss |
2006-02-21 |
| 6978229 |
Efficient method for modeling and simulation of the impact of local and global variation on integrated circuits |
Carlo Guardiani, Philip D. Schumaker, Patrick D. McNamara, Dale Coder |
2005-12-20 |
| 6530064 |
Method and apparatus for predicting an operational lifetime of a transistor |
Karthik Vasanth, Shian Aur, E. Ajith Amerasekera, Joseph C. Davis, Richard G. Burch |
2003-03-04 |
| 6388288 |
Integrating dual supply voltages using a single extra mask level |
Karthik Vasanth, Richard G. Burch, Purnendu K. Mozumder, Joseph C. Davis, Chenjing Fernando +1 more |
2002-05-14 |
| 6381564 |
Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulators |
Joseph C. Davis, Karthik Vasanth, Purnendu K. Mozumder, Suraj Rao, Chenjing Fernando +1 more |
2002-04-30 |
| 6317640 |
System and method for non-parametric modeling of processed induced variability |
Suraj Rao, Pushkar Apte, Purnendu K. Mozumder, Richard G. Burch, Karthik Vasanth +2 more |
2001-11-13 |
| 6311096 |
Design of microelectronic process flows for manufacturability and performance |
Karthik Vasanth, Richard G. Burch, Purnendu K. Mozumder, Suraj Rao, Joseph C. Davis |
2001-10-30 |
| 6157062 |
Integrating dual supply voltage by removing the drain extender implant from the high voltage device |
Karthik Vasanth, Richard G. Burch, Purnendu K. Mozumder, Chenjing Fernando, Joseph C. Davis +1 more |
2000-12-05 |
| 5912678 |
Process flow design at the module effects level through the use of acceptability regions |
Amy J. Unruh, Purnendu K. Mozumder, Richard G. Burch |
1999-06-15 |
| 5751582 |
Controlling process modules using site models and monitor wafer control |
Purnendu K. Mozumder, Gregory B. Shinn, Kelly Taylor |
1998-05-12 |
| 5642296 |
Method of diagnosing malfunctions in semiconductor manufacturing equipment |
— |
1997-06-24 |
| 5546312 |
Use of spatial models for simultaneous control of various non-uniformity metrics |
Purnendu K. Mozumder |
1996-08-13 |
| 5483636 |
Automated diagnosis using wafer tracking databases |
— |
1996-01-09 |
| 5408405 |
Multi-variable statistical process controller for discrete manufacturing |
Purnendu K. Mozumder, William W. Pu |
1995-04-18 |