Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852337 | Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Sharad Saxena, Tomasz Brozek, Mike Kyu Hyon Pak, Meindert Martin Lunenborg | 2020-12-01 |
| 10643735 | Passive array test structure for cross-point memory characterization | Tomasz Brozek, Christopher Hess, Rakesh Vallishayee, Meindert Martin Lunenborg, Hendrik Schneider +2 more | 2020-05-05 |
| 10529631 | Test structures and method for electrical measurement of FinFET fin height | Sharad Saxena, Jianjun Cheng | 2020-01-07 |
| 9952268 | Method for accurate measurement of leaky capacitors using charge based capacitance measurements | Sharad Saxena | 2018-04-24 |
| 9691669 | Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Sharad Saxena, Thomas Brozek, Mike Kyu Hyon Pak, Meindert Martin Lunenborg | 2017-06-27 |
| 7942050 | Reliability test plate for appearance treatment and the method thereof | Chung-Ming Wang | 2011-05-17 |