Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852337 | Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Sharad Saxena, Tomasz Brozek, Yuan Yu, Meindert Martin Lunenborg | 2020-12-01 |
| 9691669 | Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies | Sharad Saxena, Thomas Brozek, Yuan Yu, Meindert Martin Lunenborg | 2017-06-27 |