Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416663 | Embedded system to characterize BTI degradation effects in MOSFETs | Alberto Piadena, Tomasz Brozek, Christopher Hess, Larg Weiland, Sharad Saxena | 2025-09-16 |
| 7489151 | Layout for DUT arrays used in semiconductor wafer testing | Christopher Hess, Angelo Rossoni, Stefano Tonello, Michele Squicciarini | 2009-02-10 |
| 6535428 | Sensing circuit for memory cells | Marco Pasotti, Guido De Sandre, Giovanni Guaitini, David Iezzi, Marco Poles +1 more | 2003-03-18 |