AP

Alberto Piadena

PS Pdf Solutions: 1 patents #76 of 143Top 55%
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Patent #TitleCo-InventorsDate
12416663 Embedded system to characterize BTI degradation effects in MOSFETs Michele Quarantelli, Tomasz Brozek, Christopher Hess, Larg Weiland, Sharad Saxena 2025-09-16