Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7932105 | Systems and methods for detecting and monitoring nickel-silicide process and induced failures | Sharad Saxena, Jae-Yong Park, Mark A. Spinelli, Sr., Shiying Xiong, Hossein Karbasi | 2011-04-26 |
| 6204200 | Process scheme to form controlled airgaps between interconnect lines to reduce capacitance | Somnath Nag, Richard Scott List | 2001-03-20 |