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System and method for automated integration and stress testing of hardware and software service in management controller using containerized toolbox |
Chandrasekar Rathineswaran, Clark Kerr, Garret Naegle |
2019-10-15 |
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Methods for yield variability benchmarking, assessment, quantification, and localization |
— |
2013-07-23 |
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Integrating dual supply voltages using a single extra mask level |
Karthik Vasanth, Sharad Saxena, Richard G. Burch, Purnendu K. Mozumder, Joseph C. Davis +1 more |
2002-05-14 |
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Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulators |
Joseph C. Davis, Karthik Vasanth, Sharad Saxena, Purnendu K. Mozumder, Chenjing Fernando +1 more |
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System and method for non-parametric modeling of processed induced variability |
Sharad Saxena, Pushkar Apte, Purnendu K. Mozumder, Richard G. Burch, Karthik Vasanth +2 more |
2001-11-13 |
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Design of microelectronic process flows for manufacturability and performance |
Sharad Saxena, Karthik Vasanth, Richard G. Burch, Purnendu K. Mozumder, Joseph C. Davis |
2001-10-30 |
| 6157062 |
Integrating dual supply voltage by removing the drain extender implant from the high voltage device |
Karthik Vasanth, Richard G. Burch, Sharad Saxena, Purnendu K. Mozumder, Chenjing Fernando +1 more |
2000-12-05 |