Issued Patents All Time
Showing 51–75 of 98 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10067181 | Testing holders for chip unit and die package | Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hao Chen | 2018-09-04 |
| 10002829 | Semiconductor device and manufacturing method thereof | Hao Chen, Chen-Hsiang Hsu, Ching-Nen Peng, Mill-Jer Wang | 2018-06-19 |
| 9952279 | Apparatus for three dimensional integrated circuit testing | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Chung-Han Huang, Chung-Sheng Yuan +3 more | 2018-04-24 |
| 9923387 | Multi-mode wireless receiver apparatus and resonator circuit design | Yen-Hsun Hsu, Hao-Ping Hong | 2018-03-20 |
| 9923384 | Method for performing efficiency optimization of an electronic device, and associated apparatus | Hao-Ping Hong | 2018-03-20 |
| 9915699 | Integrated fan-out pillar probe system | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Mincent Lee, Chen-Hung Tien +1 more | 2018-03-13 |
| 9900970 | Three dimensional integrated circuit electrostatic discharge protection and prevention test interface | Mill-Jer Wang, Ching-Nen Peng, Hao Chen | 2018-02-20 |
| 9891266 | Test circuit and method | Mill-Jer Wang, Ching-Nen Peng, Sen-Kuei Hsu, Chuan-Ching Wang, Hao Chen | 2018-02-13 |
| 9880201 | Systems for probing semiconductor wafers | Mill-Jer Wang, Ching-Nen Peng, Hao Chen | 2018-01-30 |
| 9859176 | Semiconductor device, test system and method of the same | Tang-Jung Chiu, Mill-Jer Wang, Hao Chen | 2018-01-02 |
| 9817029 | Test probing structure | Mill-Jer Wang, Ching-Fang Chen, Sandeep Kumar Goel, Chung-Sheng Yuan, Chao-Yang Yeh +2 more | 2017-11-14 |
| 9754847 | Circuit probing structures and methods for probing the same | Mill-Jer Wang, Ching-Nen Peng, Hao Chen | 2017-09-05 |
| 9671457 | 3D IC testing apparatus | Mill-Jer Wang, Chih-Chia Chen, Ching-Nen Peng, Hao Chen | 2017-06-06 |
| 9664707 | Testing holders for chip unit and die package | Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hao Chen | 2017-05-30 |
| 9658281 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Mincent Lee | 2017-05-23 |
| 9653927 | Composite integrated circuits and methods for wireless interactions therewith | Min-Jer Wang, Ching-Nen Peng, Chewn-Pu Jou, Feng-Wei Kuo, Hao Chen +4 more | 2017-05-16 |
| 9640447 | Test circuit and method | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Chung-Han Huang | 2017-05-02 |
| 9606155 | Capacitance measurement circuit and method | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Chung-Han Huang | 2017-03-28 |
| 9568543 | Structure and method for testing stacked CMOS structure | Mill-Jer Wang, Ching-Nen Peng, Hao Chen | 2017-02-14 |
| 9559583 | Power converter with a wave generator that filters a wave signal to generate an output voltage | Hung-I Wang, Hao-Ping Hong, Chien-Wei Kuan, Yung-Chih Yen | 2017-01-31 |
| 9453877 | Testing holders for chip unit and die package | Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hao Chen | 2016-09-27 |
| 9448285 | Method and apparatus of wafer testing | Mill-Jer Wang, Ching-Nen Peng, Hao Chen, Shang-Ju Lee | 2016-09-20 |
| 9417285 | Integrated fan-out package-on-package testing | Mill-Jer Wang, Ching-Nen Peng, Hao Chen | 2016-08-16 |
| 9372227 | Integrated circuit test system and method | Mill-Jer Wang, Ching-Nen Peng, Wei-Hsun Lin, Hao Chen, Chung-Han Huang | 2016-06-21 |
| 9354254 | Test-yield improvement devices for high-density probing techniques and method of implementing the same | Mill-Jer Wang, Ching-Nen Peng, Wei-Hsun Lin, Sen-Kuei Hsu, De-Jian Liu | 2016-05-31 |