HL

Hung-Chih Lin

TSMC: 58 patents #552 of 12,232Top 5%
ME Mediatek: 28 patents #57 of 2,888Top 2%
YT Young Lighting Technology: 3 patents #22 of 141Top 20%
GC Glac Biotech Co.: 1 patents #19 of 28Top 70%
CC Cyntec Co.: 1 patents #90 of 175Top 55%
SC Sunplus Technology Co.: 1 patents #128 of 275Top 50%
CI Chimei Innolux: 1 patents #232 of 654Top 40%
AO Au Optronics: 1 patents #1,836 of 2,945Top 65%
Overall (All Time): #15,160 of 4,157,543Top 1%
98
Patents All Time

Issued Patents All Time

Showing 76–98 of 98 patents

Patent #TitleCo-InventorsDate
9341671 Testing holders for chip unit and die package Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hao Chen 2016-05-17
9310437 Adaptive test sequence for testing integrated circuits Chun-Cheng Chen, Mill-Jer Wang, Hao Chen, Ching-Nen Peng 2016-04-12
9252593 Three dimensional integrated circuit electrostatic discharge protection and prevention test interface Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2016-02-02
9234940 Integrated fan-out wafer architecture and test method Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2016-01-12
9129973 Circuit probing structures and methods for probing the same Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2015-09-08
9086452 Three-dimensional integrated circuit and method for wireless information access thereof Mill-Jer Wang, Chewn-Pu Jou, Ching-Nen Peng, Huan-Neng Chen, Kuang-Kai Yen +4 more 2015-07-21
8956889 Method of testing through silicon VIAS (TSVs) of three dimensional integrated circuit (3DIC) Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2015-02-17
8957691 Probe cards for probing integrated circuits Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2015-02-17
8952711 Methods for probing semiconductor wafers Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2015-02-10
8922230 3D IC testing apparatus Mill-Jer Wang, Chih-Chia Chen, Ching-Nen Peng, Hao Chen 2014-12-30
8866488 Power compensation in 3DIC testing Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2014-10-21
8836355 Dynamic testing based on thermal and stress conditions Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2014-09-16
8614105 Production flow and reusable testing method Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2013-12-24
8573811 Backlight module with heat dissipating element and heat sink Yi-Wen Lin 2013-11-05
8573794 Backlight module Yi-Wen Lin 2013-11-05
8421073 Test structures for through silicon vias (TSVs) of three dimensional integrated circuit (3DIC) Mill-Jer Wang, Ching-Nen Peng, Hao Chen 2013-04-16
8410709 Parallel light-emitting circuit of parallel LED light-emitting device and circuit board thereof 2013-04-02
8324837 Parallel light-emitting circuit of parallel LED light-emitting device and circuit board thereof 2012-12-04
8297827 Backlight module Ming-Feng Huang, Yi-Wen Lin 2012-10-30
8294844 Liquid crystal display and assembly method of the same Li-Yi Chen, Cheng-Jung Chen, Yu-Ming Lin, Yi WANG 2012-10-23
7840194 Transmitting circuit, receiving circuit, interface switching module and interface switching method for SATA and SAS interfaces Yu-Hsin Wu, Min-Chung Chou 2010-11-23
7394212 Inverter and inverter unit thereof Chin-Der Wey, Tsung-Shiun Lee, Wei-Chung Chuang 2008-07-01
7217005 Light emitting diode lamp module 2007-05-15