Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11808805 | Heterogenous voltage-based testing via on-chip voltage regulator circuits | Francisco Da Silva, Li-Wei Ko, Shyh-Horng Lin | 2023-11-07 |
| 11328112 | Timing-aware testing | Li-Wei Ko, Francisco Da Silva, Shyh-Horng Lin | 2022-05-10 |
| 10622272 | Semiconductor chip structure and semiconductor package | Chia Lun Liang | 2020-04-14 |
| 9448285 | Method and apparatus of wafer testing | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2016-09-20 |