AY

Anthony Yen

TSMC: 148 patents #130 of 12,232Top 2%
TI Texas Instruments: 3 patents #4,047 of 12,488Top 35%
📍 Hsinchu, FL: #1 of 9 inventorsTop 15%
Overall (All Time): #6,127 of 4,157,543Top 1%
151
Patents All Time

Issued Patents All Time

Showing 26–50 of 151 patents

Patent #TitleCo-InventorsDate
10276372 Method for integrated circuit patterning Chih-Tsung Shih, Shinn-Sheng Yu, Jeng-Horng Chen 2019-04-30
10274838 System and method for performing lithography process in semiconductor device fabrication Jui-Ching Wu, Jeng-Horng Chen, Chia-Chen Chen, Shu-Hao Chang, Shang-Chieh Chien +1 more 2019-04-30
10274819 EUV pellicle fabrication methods and structures thereof Pei-Cheng Hsu, Chih-Tsung Shih, Jeng-Horng Chen, Chih-Cheng Lin, Hsin-Chang Lee +2 more 2019-04-30
10168611 Mask with multilayer structure and manufacturing method by using the same Chih-Tsung Shih, Jeng-Horng Chen, Shinn-Sheng Yu 2019-01-01
10162258 Pellicle fabrication methods and structures thereof Yun-Yue Lin, Hsuan-Chen Chen, Chih-Cheng Lin, Hsin-Chang Lee, Yao-Ching Ku +3 more 2018-12-25
10162257 Extreme ultraviolet lithography system, device, and method for printing low pattern density features Yen-Cheng Lu, Shinn-Sheng Yu, Jeng-Horng Chen 2018-12-25
10156790 EUV lithography system and method with optimized throughput and stability Yen-Cheng Lu, Jeng-Horng Chen, Shun-Der Wu 2018-12-18
10036951 Pellicle assembly and fabrication methods thereof Pei-Cheng Hsu, Chih-Cheng Lin, Hsin-Chang Lee, Ta-Cheng Lien 2018-07-31
10031411 Pellicle for EUV mask and fabrication thereof Chih-Tsung Shih, Shinn-Sheng Yu, Jeng-Horng Chen 2018-07-24
10007174 Extreme ultraviolet lithography process and mask Chih-Tsung Shih, Shinn-Sheng Yu, Jeng-Horng Chen 2018-06-26
10001701 Pellicle structures and methods of fabricating thereof Pei-Cheng Hsu, Hsin-Chang Lee, Yun-Yue Lin, Hsuan-Chen Chen, Hsuan-I WANG 2018-06-19
9996013 Extreme ultraviolet lithography process and mask Yen-Cheng Lu, Jeng-Horng Chen, Shinn-Sheng Yu 2018-06-12
9995999 Lithography mask Yun-Yue Lin, Hsin-Chang Lee, Chia-Jen Chen 2018-06-12
9964850 Method to mitigate defect printability for ID pattern Yen-Cheng Lu, Chia-Hao Hsu, Shinn-Sheng Yu, Chia-Chen Chen, Jeng-Horng Chen 2018-05-08
9897910 Treating a capping layer of a mask Pei-Cheng Hsu, Chih-Cheng Lin, Ta-Cheng Lien, Wei-Shiuan Chen, Hsin-Chang Lee 2018-02-20
9886543 Method providing for asymmetric pupil configuration for an extreme ultraviolet lithography process Chia-Chun Chung, Norman Chen, Chih-Tsung Shih, Jeng-Horng Chen, Shinn-Sheng Yu 2018-02-06
9869939 Lithography process Shinn-Sheng Yu 2018-01-16
9870612 Method for repairing a mask Shinn-Sheng Yu, Wen-Chuan Wang, Sheng-Chi Chin 2018-01-16
9869928 Extreme ultraviolet light (EUV) photomasks, and fabrication methods thereof Tao Huang, Chih-Tsung Shih, Chia-Jen Chen, Hsin-Chang Lee 2018-01-16
9829785 Extreme ultraviolet lithography process and mask Yen-Cheng Lu, Shinn-Sheng Yu, Jeng-Horng Chen 2017-11-28
9823585 EUV focus monitoring systems and methods Chih-Tsung Shih, Chieh-Jen Cheng, Jeng-Horng Chen, Chia-Chen Chen, Shinn-Sheng Yu +1 more 2017-11-21
9766536 Mask with multilayer structure and manufacturing method by using the same Chih-Tsung Shih, Jeng-Horng Chen, Shinn-Sheng Yu 2017-09-19
9760015 Extreme ultraviolet lithography process Shinn-Sheng Yu, Yen-Cheng Lu 2017-09-12
9748133 Via definition scheme Yen-Cheng Lu, Chih-Tsung Shih, Shinn-Sheng Yu, Jeng-Horng Chen 2017-08-29
9733562 Extreme ultraviolet lithography process and mask Yen-Cheng Lu, Jeng-Horng Chen, Shinn-Sheng Yu 2017-08-15