Issued Patents All Time
Showing 26–50 of 61 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6419844 | Method for fabricating calibration target for calibrating semiconductor wafer test systems | Andrew J. Krivy, Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark | 2002-07-16 |
| 6407570 | Interconnect for testing semiconductor components having support members for preventing component flexure | Warren M. Farnworth, Mike Hess, David R. Hembree, James M. Wark, Salman Akram | 2002-06-18 |
| 6396291 | Method for testing semiconductor components | Salman Akram, David R. Hembree, Warren M. Farnworth, Derek Gochnour, Alan G. Wood | 2002-05-28 |
| 6380756 | Burin carrier and semiconductor die assembly | Walter L. Moden | 2002-04-30 |
| 6369600 | Test carrier for testing semiconductor components including interconnect with support members for preventing component flexure | Warren M. Farnworth, Mike Hess, David R. Hembree, James M. Wark, Salman Akram | 2002-04-09 |
| 6363295 | Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs | Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, Michael E. Hess +2 more | 2002-03-26 |
| 6362637 | Apparatus for testing semiconductor wafers including base with contact members and terminal contacts | Warren M. Farnworth, Salman Akram, Alan G. Wood, David R. Hembree, James M. Wark | 2002-03-26 |
| 6353312 | Method for positioning a semiconductor die within a temporary package | Warren M. Farnworth, Jennifer L. Folaron, Robert Folaron, David R. Hembree, Jay C. Nelson +1 more | 2002-03-05 |
| 6353326 | Test carrier with molded interconnect for testing semiconductor components | David R. Hembree, Salman Akram, Warren M. Farnworth, Alan G. Wood, Derek Gochnour +2 more | 2002-03-05 |
| 6296171 | Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems | David R. Hembree, Michael E. Hess, Warren M. Farnworth, Alan G. Wood | 2001-10-02 |
| 6247629 | Wire bond monitoring system for layered packages | Derek Gochnour, Steven G. Thummel | 2001-06-19 |
| 6239590 | Calibration target for calibrating semiconductor wafer test systems | Andrew J. Krivy, Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark | 2001-05-29 |
| 6210984 | Method and apparatus for automatically positioning electronic dice within component packages | Warren M. Farnworth, Alan G. Wood, David R. Hembree, James M. Wark, Jennifer L. Folaron +3 more | 2001-04-03 |
| 6208157 | Method for testing semiconductor components | Salman Akram, David R. Hembree, Warren M. Farnworth, Derek Gochnour, Alan G. Wood | 2001-03-27 |
| 6208578 | Partial replacement of partially defective memory devices | — | 2001-03-27 |
| 6150828 | Method and apparatus for automatically positioning electronic dice with component packages | Warren M. Farnworth, Alan G. Wood, David R. Hembree, James M. Wark, Jennifer L. Folaron +3 more | 2000-11-21 |
| 6085962 | Wire bond monitoring system for layered packages | Derek Gochnour, Steven G. Thummel | 2000-07-11 |
| 6072326 | System for testing semiconductor components | Salman Akram, David R. Hembree, Warren M. Farnworth, Derek Gochnour, Alan G. Wood | 2000-06-06 |
| 6064194 | Method and apparatus for automatically positioning electronic dice within component packages | Warren M. Farnworth, Jennifer L. Folaron, Robert Folaron, David R. Hembree, Jay C. Nelson +1 more | 2000-05-16 |
| 6064216 | Apparatus for testing semiconductor wafers | Warren M. Farnworth, Salman Akram, Alan G. Wood, David R. Hembree, James M. Wark | 2000-05-16 |
| 6064221 | Method of temporarily securing a die to a burn-in carrier | Walter L. Moden | 2000-05-16 |
| 6057597 | Semiconductor package with pre-fabricated cover | Warren M. Farnworth, David R. Hembree, Derek Gochnour, Salman Akram, James M. Wark +1 more | 2000-05-02 |
| 6045026 | Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems | David R. Hembree, Michael E. Hess, Warren M. Farnworth, Alan G. Wood | 2000-04-04 |
| 6009025 | Partial replacement of partially defective memory devices | — | 1999-12-28 |
| 5955877 | Method and apparatus for automatically positioning electronic dice within component packages | Warren M. Farnworth, Alan G. Wood, David R. Hembree, James M. Wark, Jennifer L. Folaron +3 more | 1999-09-21 |