| 7268574 |
Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces |
Ralph Schaeffer |
2007-09-11 |
| 7250780 |
Probe card for semiconductor wafers having mounting plate and socket |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty |
2007-07-31 |
| 6798224 |
Method for testing semiconductor wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty |
2004-09-28 |
| 6623345 |
Wafer for cleaning semiconductor device probe |
Larry D. Angell |
2003-09-23 |
| 6419844 |
Method for fabricating calibration target for calibrating semiconductor wafer test systems |
Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson |
2002-07-16 |
| 6420892 |
Calibration target for calibrating semiconductor wafer test systems |
Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson |
2002-07-16 |
| 6359456 |
Probe card and test system for semiconductor wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty |
2002-03-19 |
| 6275052 |
Probe card and testing method for semiconductor wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty |
2001-08-14 |
| 6257958 |
Method for cleaning semiconductor device probe |
Larry D. Angell |
2001-07-10 |
| 6254469 |
Wafer for cleaning semiconductor device probe |
Larry D. Angell |
2001-07-03 |
| 6239590 |
Calibration target for calibrating semiconductor wafer test systems |
Warren M. Farnworth, David R. Hembree, Salman Akram, James M. Wark, John O. Jacobson |
2001-05-29 |
| 6060891 |
Probe card for semiconductor wafers and method and system for testing wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, C. Patrick Doherty |
2000-05-09 |
| 6023172 |
Light-based method and apparatus for maintaining probe cards |
— |
2000-02-08 |
| 6019663 |
System for cleaning semiconductor device probe |
Larry D. Angell |
2000-02-01 |
