Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7268574 | Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces | Andrew J. Krivy | 2007-09-11 |
| 7170304 | Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic components | Brett Crump | 2007-01-30 |
| 7145355 | Selectively configurable probe structures, e.g., for testing microelectronic components | Brett Crump | 2006-12-05 |
| 6972580 | Selectively configurable probe structures, e.g., for testing microelectronic components | Brett Crump | 2005-12-06 |
| 6952109 | Selectively configurable probe structures, e.g., for testing microelectronic components | Brett Crump | 2005-10-04 |
| 6924653 | Selectively configurable microelectronic probes | Brett Crump | 2005-08-02 |
| 6446021 | Method and apparatus to display processing parameter | — | 2002-09-03 |