Patents per Year
Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7268574 | Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces | Andrew J. Krivy | 2007-09-11 | $1,295,000 |
| 7170304 | Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic components | Brett Crump | 2007-01-30 | $2,478,000 |
| 7145355 | Selectively configurable probe structures, e.g., for testing microelectronic components | Brett Crump | 2006-12-05 | $3,300,000 |
| 6972580 | Selectively configurable probe structures, e.g., for testing microelectronic components | Brett Crump | 2005-12-06 | $2,816,000 |
| 6952109 | Selectively configurable probe structures, e.g., for testing microelectronic components | Brett Crump | 2005-10-04 | $1,778,000 |
| 6924653 | Selectively configurable microelectronic probes | Brett Crump | 2005-08-02 | $1,941,000 |
| 6446021 | Method and apparatus to display processing parameter | — | 2002-09-03 | $3,391,000 |