Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Selectively configurable probe structures, e.g., for testing microelectronic components

Selectively configurable probe structures, e.g., for testing microelectronic components

US Patent 6972580 · Granted Dec 6, 2005

Estimated economic value: $2,816,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe interposers and methods of fabricating probe interposers2008
Systems and methods for sensing obstructions associated with electrical testing 2007
Planarity diagnostic system, e.g., for microelectronic component test systems2007
Planarity diagnostic system, E.G., for microelectronic component test systems2007
Selectively configurable probe structures, e.g., selectively configurable probe 2007
Selectively configurable probe structures, e.g., selectively configurable probe 2007
Selectively configurable probe structures, e.g., for testing microelectronic com2006
Selectively configurable probe structures, e.g., for testing microelectronic com2006
Planarity diagnostic system, e.g., for microelectronic component test systems2006
Selectively configurable probe structures, e.g., for testing microelectronic com2005
Selectively configurable probe structures, e.g., for testing microelectronic com2005
Selectively configurable microelectronic probes2005