Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7459923 | Probe interposers and methods of fabricating probe interposers | John Caldwell, Jerry McBride, Phil Byrd | 2008-12-02 |
| 7253608 | Planarity diagnostic system, e.g., for microelectronic component test systems | Michael Martin | 2007-08-07 |
| 7211997 | Planarity diagnostic system, E.G., for microelectronic component test systems | Michael Martin | 2007-05-01 |
| 7170304 | Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic components | Ralph Schaeffer | 2007-01-30 |
| 7145355 | Selectively configurable probe structures, e.g., for testing microelectronic components | Ralph Schaeffer | 2006-12-05 |
| 7019512 | Planarity diagnostic system, e.g., for microelectronic component test systems | Michael Martin | 2006-03-28 |
| 6972580 | Selectively configurable probe structures, e.g., for testing microelectronic components | Ralph Schaeffer | 2005-12-06 |
| 6952109 | Selectively configurable probe structures, e.g., for testing microelectronic components | Ralph Schaeffer | 2005-10-04 |
| 6924653 | Selectively configurable microelectronic probes | Ralph Schaeffer | 2005-08-02 |
| 6841991 | Planarity diagnostic system, E.G., for microelectronic component test systems | Michael Martin | 2005-01-11 |