| 7459923 |
Probe interposers and methods of fabricating probe interposers |
John Caldwell, Jerry McBride, Phil Byrd |
2008-12-02 |
| 7253608 |
Planarity diagnostic system, e.g., for microelectronic component test systems |
Michael Martin |
2007-08-07 |
| 7211997 |
Planarity diagnostic system, E.G., for microelectronic component test systems |
Michael Martin |
2007-05-01 |
| 7170304 |
Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic components |
Ralph Schaeffer |
2007-01-30 |
| 7145355 |
Selectively configurable probe structures, e.g., for testing microelectronic components |
Ralph Schaeffer |
2006-12-05 |
| 7019512 |
Planarity diagnostic system, e.g., for microelectronic component test systems |
Michael Martin |
2006-03-28 |
| 6972580 |
Selectively configurable probe structures, e.g., for testing microelectronic components |
Ralph Schaeffer |
2005-12-06 |
| 6952109 |
Selectively configurable probe structures, e.g., for testing microelectronic components |
Ralph Schaeffer |
2005-10-04 |
| 6924653 |
Selectively configurable microelectronic probes |
Ralph Schaeffer |
2005-08-02 |
| 6841991 |
Planarity diagnostic system, E.G., for microelectronic component test systems |
Michael Martin |
2005-01-11 |
