John Caldwell has been granted 15 US patents while listed as an inventor at Micron . The first was granted in 2002 and the most recent in December 2022. John Caldwell ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list John Caldwell in Tucson, AZ, US.
Patents per Year Patents granted per year, 2002 to 2022 Bar chart with a peak of 2 patents in 2007. peak 2 2002: 1 patents 2002 2005: 1 patents 2006: 1 patents 2006 2007: 2 patents 2008: 2 patents 2008 2009: 1 patents 2011: 2 patents 2011 2014: 1 patents 2015: 2 patents 2015 2018: 1 patents 2022: 1 patents 2022
Issued Patents All Time
Profile Widget
Showing 1–15 of 15 patents
Patent # Title Co-Inventors Date Approx Value ⓘ
11519877
Devices and methods for contactless dielectrophoresis for cell or particle manipulation
Rafael V. Davalos , Hadi Shafiee , Michael B. Sano
2022-12-06
10078066
Devices and methods for contactless dielectrophoresis for cell or particle manipulation
Rafael V. Davalos , Hadi Shafiee , Michael B. Sano
2018-09-18
8968542
Devices and methods for contactless dielectrophoresis for cell or particle manipulation
Rafael V. Davalos , Hadi Shafiee , Michael B. Sano
2015-03-03
8926606
Integration of very short electric pulses for minimally to noninvasive electroporation
Rafael V. Davalos , Christopher B. Arena
2015-01-06
8701686
Flossing devices and methods of using same
—
2014-04-22
7884629
Probe card layout
—
2011-02-08
$5,929,000
7868630
Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same
Randy Cleverly
2011-01-11
$3,670,000
7573276
Probe card layout
—
2009-08-11
$4,144,000
7459923
Probe interposers and methods of fabricating probe interposers
Jerry McBride , Brett Crump , Phil Byrd
2008-12-02
$734,000
7358517
Method and apparatus for imager quality testing
—
2008-04-15
$1,839,000
7256595
Test sockets, test systems, and methods for testing microfeature devices
Mark A. Tverdy , Michael Slaughter
2007-08-14
$2,127,000
7213330
Method of fabricating an electronic device
William J. Casey
2007-05-08
$1,698,000
7122819
Method and apparatus for imager die package quality testing
—
2006-10-17
$1,850,000
6974330
Electronic devices incorporating electrical interconnections with improved reliability and methods of fabricating same
William J. Casey
2005-12-13
$1,839,000
6441606
Dual zone wafer test apparatus
James P. Nuxoll , Robert Totorica
2002-08-27
$3,113,000