| 7250780 |
Probe card for semiconductor wafers having mounting plate and socket |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy |
2007-07-31 |
| 6853211 |
Method and system having switching network for testing semiconductor components on a substrate |
Jorge L. de Varona, Salman Akram |
2005-02-08 |
| 6798224 |
Method for testing semiconductor wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy |
2004-09-28 |
| 6677776 |
Method and system having switching network for testing semiconductor components on a substrate |
Salman Akram, Jorge L. de Varona |
2004-01-13 |
| 6466047 |
System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources |
Jorge L. deVarona, Salman Akram |
2002-10-15 |
| 6433574 |
Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources |
Jorge L. deVarona, Salman Akram |
2002-08-13 |
| 6366112 |
Probe card having on-board multiplex circuitry for expanding tester resources |
Jorge L. deVarona, Salman Akram |
2002-04-02 |
| 6359456 |
Probe card and test system for semiconductor wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy |
2002-03-19 |
| 6356098 |
Probe card, test method and test system for semiconductor wafers |
Salman Akram, Warren M. Farnworth, David R. Hembree |
2002-03-12 |
| 6337577 |
Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources |
Jorge L. deVarona, Salman Akram |
2002-01-08 |
| 6300786 |
Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources |
Jorge L. deVarona, Salman Akram |
2001-10-09 |
| 6275052 |
Probe card and testing method for semiconductor wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy |
2001-08-14 |
| 6246250 |
Probe card having on-board multiplex circuitry for expanding tester resources |
Jorge L. deVarona, Salman Akram |
2001-06-12 |
| 6246245 |
Probe card, test method and test system for semiconductor wafers |
Salman Akram, Warren M. Farnworth, David R. Hembree |
2001-06-12 |
| 6060891 |
Probe card for semiconductor wafers and method and system for testing wafers |
David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy |
2000-05-09 |
