C. Patrick Doherty — 15 Patents at Micron

C. Patrick Doherty has been granted 15 US patents while listed as an inventor at Micron. The first was granted in 2000 and the most recent in July 2007. C. Patrick Doherty ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list C. Patrick Doherty in Boise, ID, US.

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7250780	Probe card for semiconductor wafers having mounting plate and socket	David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy	2007-07-31	$2,221,000
6853211	Method and system having switching network for testing semiconductor components on a substrate	Jorge L. de Varona, Salman Akram	2005-02-08	$1,358,000
6798224	Method for testing semiconductor wafers	David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy	2004-09-28	$1,802,000
6677776	Method and system having switching network for testing semiconductor components on a substrate	Salman Akram, Jorge L. de Varona	2004-01-13	$2,653,000
6466047	System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources	Jorge L. deVarona, Salman Akram	2002-10-15	$3,142,000
6433574	Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources	Jorge L. deVarona, Salman Akram	2002-08-13	$4,267,000
6366112	Probe card having on-board multiplex circuitry for expanding tester resources	Jorge L. deVarona, Salman Akram	2002-04-02	$5,739,000
6359456	Probe card and test system for semiconductor wafers	David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy	2002-03-19	$8,667,000
6356098	Probe card, test method and test system for semiconductor wafers	Salman Akram, Warren M. Farnworth, David R. Hembree	2002-03-12	$8,055,000
6337577	Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources	Jorge L. deVarona, Salman Akram	2002-01-08	$15,150,000
6300786	Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources	Jorge L. deVarona, Salman Akram	2001-10-09	$5,877,000
6275052	Probe card and testing method for semiconductor wafers	David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy	2001-08-14	$11,619,000
6246250	Probe card having on-board multiplex circuitry for expanding tester resources	Jorge L. deVarona, Salman Akram	2001-06-12	$18,079,000
6246245	Probe card, test method and test system for semiconductor wafers	Salman Akram, Warren M. Farnworth, David R. Hembree	2001-06-12	$18,079,000
6060891	Probe card for semiconductor wafers and method and system for testing wafers	David R. Hembree, Warren M. Farnworth, Salman Akram, Alan G. Wood, Andrew J. Krivy	2000-05-09	$21,059,000

C. Patrick Doherty — 15 Patents

Issued Patents All Time

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