JV

Jorge L. de Varona

Micron: 6 patents #2,080 of 6,345Top 35%
📍 Boise, ID: #1,092 of 3,546 inventorsTop 35%
🗺 Idaho: #1,889 of 8,810 inventorsTop 25%
Overall (All Time): #876,679 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
6954000 Semiconductor component with redistribution circuit having conductors and test contacts David R. Hembree 2005-10-11
6933524 Semiconductor component having test contacts David R. Hembree 2005-08-23
6853211 Method and system having switching network for testing semiconductor components on a substrate C. Patrick Doherty, Salman Akram 2005-02-08
6677776 Method and system having switching network for testing semiconductor components on a substrate C. Patrick Doherty, Salman Akram 2004-01-13
6620633 Method for testing bumped semiconductor components David R. Hembree 2003-09-16
6380555 Bumped semiconductor component having test pads, and method and system for testing bumped semiconductor components David R. Hembree 2002-04-30