JH

Joseph C. Holzer

MM Memc Electronic Materials: 23 patents #3 of 273Top 2%
JM Joanna Western Mills: 3 patents #1 of 4Top 25%
Eastman Kodak: 2 patents #3,607 of 8,114Top 45%
CL Corner Star Limited: 1 patents #21 of 48Top 45%
GB Gaylord Bros.: 1 patents #4 of 4Top 100%
Overall (All Time): #124,919 of 4,157,543Top 4%
30
Patents All Time

Issued Patents All Time

Showing 25 most recent of 30 patents

Patent #TitleCo-InventorsDate
10337118 Apparatus and method for doping a semiconductor melt comprising a seed chuck, a seed crystal connected to the seed chuck, and a dopant container connected to the seed chuck between a first and second end of the apparatus Jihong Chen 2019-07-02
8398765 Controlling a melt-solid interface shape of a growing silicon crystal using an unbalanced magnetic field and iso-rotation Hariprasad Sreedharamurthy, Milind Kulkarni, Richard G. Schrenker, Harold W. Korb 2013-03-19
7573587 Method and device for continuously measuring silicon island elevation Zheng Lu, Steven L. Kimbel, Robert H. Fuerhoff 2009-08-11
7442253 Process for forming low defect density, ideal oxygen precipitating silicon Robert J. Falster, Marco Cornara, Daniela Gambaro, Massimiliano Olmo, Steve A. Markgraf +3 more 2008-10-28
7229693 Low defect density, ideal oxygen precipitating silicon Robert J. Falster, Marco Cornara, Daniela Gambaro, Massimiliano Olmo, Steve A. Markgraf +3 more 2007-06-12
7097718 Single crystal silicon wafer having an epitaxial layer substantially free from grown-in defects Luciano Mule'Stagno, Lu Fei, Harold W. Korb, Robert J. Falster 2006-08-29
6896728 Process for producing low defect density, ideal oxygen precipitating silicon Robert J. Falster, Marco Cornara, Daniela Gambaro, Massimiliano Olmo, Steve A. Markgraf +3 more 2005-05-24
6840997 Vacancy, dominsated, defect-free silicon Robert Falster, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid, Bayard K. Johnson 2005-01-11
6635587 Method for producing czochralski silicon free of agglomerated self-interstitial defects Luciano Mule'Stagno, Jeffrey L. Libbert 2003-10-21
6632278 Low defect density epitaxial wafer and a process for the preparation thereof Robert Falster, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid, Bayard K. Johnson 2003-10-14
6605150 Low defect density regions of self-interstitial dominated silicon Robert J. Falster 2003-08-12
6565649 Epitaxial wafer substantially free of grown-in defects Luciano Mule′Stagno, Lu Fei, Harold W. Korb, Robert J. Falster 2003-05-20
6555194 Process for producing low defect density, ideal oxygen precipitating silicon Robert Falster, Marco Cornara, Daniela Gambaro, Massimiliano Olmo, Steve A. Markgraf +3 more 2003-04-29
6409827 Low defect density silicon and a process for producing low defect density silicon wherein V/G0 is controlled by controlling heat transfer at the melt/solid interface Robert J. Falster 2002-06-25
6409826 Low defect density, self-interstitial dominated silicon Robert Falster, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid, Bayard K. Johnson 2002-06-25
6379642 Vacancy dominated, defect-free silicon Robert Falster, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid, Bayard K. Johnson 2002-04-30
6287380 Low defect density silicon Robert J. Falster 2001-09-11
6284039 Epitaxial silicon wafers substantially free of grown-in defects Luciano Mule'Stagno, Lu Fei, Harold W. Korb, Robert J. Falster 2001-09-04
6254672 Low defect density self-interstitial dominated silicon Robert Falster, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid, Bayard K. Johnson 2001-07-03
6190631 Low defect density, ideal oxygen precipitating silicon Robert Falster, Marco Cornara, Daniela Gambaro, Massimiliano Olmo, Steve A. Markgraf +3 more 2001-02-20
5919302 Low defect density vacancy dominated silicon Robert Falster, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid, Bayard K. Johnson 1999-07-06
5779791 Process for controlling thermal history of Czochralski-grown silicon Harold W. Korb, Sadasivam Chandrasekhar, Robert J. Falster, Kyong-Min Kim, Steven L. Kimbel +1 more 1998-07-14
5573680 Method for etching a semiconductor material without altering flow pattern defect distribution Roger W. Shaw 1996-11-12
5550374 Methods and apparatus for determining interstitial oxygen content of relatively large diameter silicon crystals by infrared spectroscopy Harold W. Korb, Klaus Drescher 1996-08-27
4990248 Reverse osmosis apparatus Barry M. Brown, Evan A. Edwards, Augustine Pavel, Frederick Tone, Henry L. West 1991-02-05