Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11699615 | High resistivity semiconductor-on-insulator wafer and a method of manufacture | Igor Peidous, Jeffrey L. Libbert, Andrew M. Jones, Alex Usenko, Gang Wang +2 more | 2023-07-11 |
| 11139198 | High resistivity semiconductor-on-insulator wafer and a method of manufacturing | Igor Peidous, Jeffrey L. Libbert, Andrew M. Jones, Alex Usenko, Gang Wang +2 more | 2021-10-05 |
| 10529590 | Annealing method for improving bonding strength | Xing Wei, Yongwei Chang, Meng Chen, Guoxing CHEN, Xi Wang | 2020-01-07 |
| 10483152 | High resistivity semiconductor-on-insulator wafer and a method of manufacturing | Igor Peidous, Jeffrey L. Libbert, Andrew M. Jones, Alex Usenko, Gang Wang +2 more | 2019-11-19 |
| 10388529 | Method for preparing substrate with insulated buried layer | Xing Wei, Yongwei Chang, Meng Chen, Guoxing CHEN, Xi Wang | 2019-08-20 |
| 10361114 | Method for preparing substrate with carrier trapping center | Xing Wei, Yongwei Chang, Meng Chen, Guoxing CHEN, Xi Wang | 2019-07-23 |
| 9343379 | Method to delineate crystal related defects | Jeffrey L. Libbert | 2016-05-17 |
| 8846493 | Methods for producing silicon on insulator structures having high resistivity regions in the handle wafer | Jeffrey L. Libbert, Robert W. Standley | 2014-09-30 |
| 8822242 | Methods for monitoring the amount of metal contamination in a process | Jeffrey L. Libbert | 2014-09-02 |
| 8440541 | Methods for reducing the width of the unbonded region in SOI structures | John A. Pitney, Ichiro Yoshimura | 2013-05-14 |
| 8330245 | Semiconductor wafers with reduced roll-off and bonded and unbonded SOI structures produced from same | John A. Pitney, Ichiro Yoshimura | 2012-12-11 |
| 8143078 | Methods for monitoring the amount of contamination imparted into semiconductor wafers during wafer processing | Jeffrey L. Libbert | 2012-03-27 |
| 7097718 | Single crystal silicon wafer having an epitaxial layer substantially free from grown-in defects | Luciano Mule'Stagno, Joseph C. Holzer, Harold W. Korb, Robert J. Falster | 2006-08-29 |
| 6565649 | Epitaxial wafer substantially free of grown-in defects | Luciano Mule′Stagno, Joseph C. Holzer, Harold W. Korb, Robert J. Falster | 2003-05-20 |
| 6284039 | Epitaxial silicon wafers substantially free of grown-in defects | Luciano Mule'Stagno, Joseph C. Holzer, Harold W. Korb, Robert J. Falster | 2001-09-04 |