Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6565649 | Epitaxial wafer substantially free of grown-in defects | Lu Fei, Joseph C. Holzer, Harold W. Korb, Robert J. Falster | 2003-05-20 |
| 6391662 | Process for detecting agglomerated intrinsic point defects by metal decoration | Robert J. Falster | 2002-05-21 |