BJ

Bayard K. Johnson

MM Memc Electronic Materials: 13 patents #12 of 273Top 5%
GL Gtat Ip Holding Llc.: 3 patents #2 of 12Top 20%
Overall (All Time): #294,763 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
10544517 Growth of a uniformly doped silicon ingot by doping only the initial charge 2020-01-28
10202705 Silicon ingot having uniform multiple dopants and method and apparatus for producing same John P. DeLuca, William L. Luter 2019-02-12
9051659 Silicon single crystal doped with gallium, indium, or aluminum John P. DeLuca, Frank S. Delk, II, William L. Luter, Neil Middendorf, Dick S. Williams +2 more 2015-06-09
7442253 Process for forming low defect density, ideal oxygen precipitating silicon Robert J. Falster, Joseph C. Holzer, Marco Cornara, Daniela Gambaro, Massimiliano Olmo +3 more 2008-10-28
7229693 Low defect density, ideal oxygen precipitating silicon Robert J. Falster, Joseph C. Holzer, Marco Cornara, Daniela Gambaro, Massimiliano Olmo +3 more 2007-06-12
6896728 Process for producing low defect density, ideal oxygen precipitating silicon Robert J. Falster, Joseph C. Holzer, Marco Cornara, Daniela Gambaro, Massimiliano Olmo +3 more 2005-05-24
6840997 Vacancy, dominsated, defect-free silicon Robert Falster, Joseph C. Holzer, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid 2005-01-11
6632278 Low defect density epitaxial wafer and a process for the preparation thereof Robert Falster, Joseph C. Holzer, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid 2003-10-14
6555194 Process for producing low defect density, ideal oxygen precipitating silicon Robert Falster, Joseph C. Holzer, Marco Cornara, Daniela Gambaro, Massimiliano Olmo +3 more 2003-04-29
6409826 Low defect density, self-interstitial dominated silicon Robert Falster, Joseph C. Holzer, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid 2002-06-25
6379642 Vacancy dominated, defect-free silicon Robert Falster, Joseph C. Holzer, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid 2002-04-30
6315828 Continuous oxidation process for crystal pulling apparatus John D. Holder 2001-11-13
6254672 Low defect density self-interstitial dominated silicon Robert Falster, Joseph C. Holzer, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid 2001-07-03
6190631 Low defect density, ideal oxygen precipitating silicon Robert Falster, Joseph C. Holzer, Marco Cornara, Daniela Gambaro, Massimiliano Olmo +3 more 2001-02-20
6039801 Continuous oxidation process for crystal pulling apparatus John D. Holder 2000-03-21
5919302 Low defect density vacancy dominated silicon Robert Falster, Joseph C. Holzer, Steve A. Markgraf, Paolo Mutti, Seamus A. McQuaid 1999-07-06