YK

Yutaka Kaneko

KO Konica: 28 patents #18 of 1,958Top 1%
TS Tetra Laval Holdings & Finance S.A.: 25 patents #4 of 1,364Top 1%
HI Hitachi: 23 patents #1,433 of 28,497Top 6%
KC Konishiroku Photo Industry Co.: 22 patents #11 of 894Top 2%
Ricoh Company: 14 patents #1,578 of 9,818Top 20%
Nissan Motor Co.: 8 patents #916 of 8,689Top 15%
SC Sanyo Electric Co.: 4 patents #1,493 of 6,347Top 25%
JA Jatco: 3 patents #227 of 871Top 30%
SS Saginomiya Seisakusho: 2 patents #65 of 162Top 45%
HH Hitachi High-Technologies: 1 patents #1,282 of 1,917Top 70%
NC Nippon Seiki Co.: 1 patents #124 of 311Top 40%
TA Tetra Pak International Aktiebolag: 1 patents #4 of 11Top 40%
NJ National Space Development Agency Of Japan: 1 patents #12 of 103Top 15%
OC Oki Electric Industry Co.: 1 patents #1,459 of 2,807Top 55%
📍 Yokohama, IL: #1 of 17 inventorsTop 6%
Overall (All Time): #7,498 of 4,157,543Top 1%
137
Patents All Time

Issued Patents All Time

Showing 26–50 of 137 patents

Patent #TitleCo-InventorsDate
7232996 Method and an apparatus of an inspection system using an electron beam Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami +6 more 2007-06-19
7173892 Method and apparatus for validating security information by scattering the ID bits to plurality of locations and selecting a bit value with highest frequency in each column of bits as correct bit value 2007-02-06
7098455 Method of inspecting a circuit pattern and inspecting instrument Hiroyuki Shinada, Atsuko Takafuji, Takanori Ninomiya, Yuko Sasaki, Mari Nozoe +5 more 2006-08-29
7026830 Method and apparatus for inspecting integrated circuit pattern Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more 2006-04-11
7012252 Method and an apparatus of an inspection system using an electron beam Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami +6 more 2006-03-14
6987265 Method and an apparatus of an inspection system using an electron beam Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami +6 more 2006-01-17
6810303 INJECTION MOLD, A PRODUCTION METHOD THEREOF, A PRODUCTION SYSTEM THEREOF, A DESIGNING APPARATUS AND A DESIGNING COMPUTER PROGRAM THEREOF, AN INJECTION METHOD, A MOLDED COMPONENT, AND AN OPTICAL SYSTEM THEREWITH Eiri Sagae, Hiroyuki Endoh, Yasuo Yamanaka, Toshiyuki Iseki, Kohei Shimbo 2004-10-26
6735511 Brake control system for vehicle Hideo Nakamura, Junji Tsutsumi, Kazuhiko Tazoe, Hiroyuki Ashizawa 2004-05-11
6583413 Method of inspecting a circuit pattern and inspecting instrument Hiroyuki Shinada, Atsuko Takafuji, Takanori Ninomiya, Yuko Sasaki, Mari Nozoe +5 more 2003-06-24
6559663 Method and apparatus for inspecting integrated circuit pattern Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more 2003-05-06
6518548 Substrate temperature control system and method for controlling temperature of substrate Masakazu Sugaya, Fumio Murai, Masafumi Kanetomo, Shigeki Hirasawa, Tomoji Watanabe +2 more 2003-02-11
6512227 Method and apparatus for inspecting patterns of a semiconductor device with an electron beam Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami +6 more 2003-01-28
6452178 Method and an apparatus of an inspection system using an electron beam Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami +6 more 2002-09-17
6430491 Speed ratio control system of continuously variable transmission Kazutaka Adachi, Hiroyuki Ashizawa 2002-08-06
6394797 Substrate temperature control system and method for controlling temperature of substrate Masakazu Sugaya, Fumio Murai, Masafumi Kanetomo, Shigeki Hirasawa, Tomoji Watanabe +2 more 2002-05-28
6390513 Collapsible spacer pipe 2002-05-21
6348690 Method and an apparatus of an inspection system using an electron beam Yuko Iwabuchi, Hideo Todokoro, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami +6 more 2002-02-19
6329826 Method and apparatus for inspecting integrated circuit pattern Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more 2001-12-11
6172363 Method and apparatus for inspecting integrated circuit pattern Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more 2001-01-09
6133997 System for spotting moving objects based on a plurality of artificial satellites Koji Yamawaki, Yasuhiro Takami, Yoko Nishio, Takahiro Kinoshita 2000-10-17
5992455 Dual-stream filling valve Adam Koller, Sven-Arne Andersson, Bengt Andersson 1999-11-30
5979514 Hygienic fill system for a packaging machine Bengt Andersson 1999-11-09
5950987 In-line lever actuated valve 1999-09-14
5897304 Flow-through vertical filling pump with a plurality of diaphragms 1999-04-27
5896888 Dual-stream filling valve Adam Koller, Sven-Arne Andersson, Bengt Andersson 1999-04-27