Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11862522 | Accuracy improvements in optical metrology | Barak Bringoltz, Evgeni Gurevich, Ido Adam, Yoel Feler, Dror Alumot +6 more | 2024-01-02 |
| 11360397 | System and method for application of harmonic detectivity as a quality indicator for imaging-based overlay measurements | Gil Drachuck, David Gready | 2022-06-14 |
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |