SS

Shuichi Samata

KT Kabushiki Kaisha Toshiba: 27 patents #978 of 21,451Top 5%
SU Sumco: 5 patents #70 of 464Top 20%
Overall (All Time): #112,797 of 4,157,543Top 3%
32
Patents All Time

Issued Patents All Time

Showing 1–25 of 32 patents

Patent #TitleCo-InventorsDate
11183433 Method of evaluating silicon layer and a method of manufacturing silicon epitaxial wafer Sayaka MAKISE, Noritomo Mitsugi, Sumio Miyazaki 2021-11-23
11047800 Method of evaluating carbon concentration of silicon sample, method of evaluating silicon wafer manufacturing process, method of manufacturing silicon wafer, method of manufacturing silicon single crystal ingot, silicon single crystal ingot and silicon wafer Kazutaka Eriguchi, Syun Sasaki 2021-06-29
10935510 Method of measuring carbon concentration of silicon sample, method of manufacturing silicon single crystal ingot, silicon single crystal ingot and silicon wafer Kazutaka Eriguchi, Noritomo Mitsugi, Ayumi Masada 2021-03-02
10676840 Method of evaluating manufacturing process of silicon material and manufacturing method of silicon material Noritomo Mitsugi, Kazutaka Eriguchi, Ayumi Masada 2020-06-09
8173523 Method of removing heavy metal in semiconductor substrate Noritomo Mitsugi, Masataka Hourai, Kiyoshi Nagai, Kei Matsumoto 2012-05-08
7844433 System, method and program for designing a utility facility and method for manufacturing a product by the utility facility Toshikatsu Masuda, Toshinori Shinki, Yuuichi Mikata 2010-11-30
7065469 Manufacturing apparatus and method for predicting life of a manufacturing apparatus which uses a rotary machine Takeo Furuhata, Yukihiro Ushiku, Akihito Yamamoto, Takashi Nakao 2006-06-20
6944572 Apparatus for predicting life of rotary machine and equipment using the same Yukihiro Ushiku, Tsunetoshi Arikado, Takashi Nakao, Yuuichi Mikata 2005-09-13
6937963 Method for avoiding irregular shutoff of production equipment and system for avoiding irregular shutoff Ken Ishii, Takashi Nakao, Yukihiro Ushiku 2005-08-30
6909993 Method for diagnosing failure of a manufacturing apparatus and a failure diagnosis system Takashi Nakao, Yukihiro Ushiku, Hiroshi Akahori, Ken Ishii 2005-06-21
6898551 System for predicting life of a rotary machine, method for predicting life of a manufacturing apparatus which uses a rotary machine and a manufacturing apparatus Yukihiro Ushiku, Akihito Yamamoto, Takashi Nakao, Takeo Furuhata 2005-05-24
6885972 Method for predicting life span of rotary machine used in manufacturing apparatus and life predicting system Yukihiro Ushiku, Takeo Furuhata, Takashi Nakao, Ken Ishii 2005-04-26
6865513 Method for predicting life of rotary machine and determining repair timing of rotary machine Yukihiro Ushiku, Tsunetoshi Arikado, Takashi Nakao, Yuuichi Mikata 2005-03-08
6766275 Method for diagnosing life of manufacturing equipment using rotary machine Yukihiro Ushiku, Ken Ishii, Takashi Nakao 2004-07-20
6008110 Semiconductor substrate and method of manufacturing same Yoshiaki Matsushita, Yoko Inoue 1999-12-28
5951755 Manufacturing method of semiconductor substrate and inspection method therefor Moriya Miyashita, Masanobu Ogino, Tadahide Hoshi, Masanori Numano, Akiko Sekihara +1 more 1999-09-14
5738942 Semiconductor silicon wafer and process for producing it Atsuko Kubota, Masakatu Kojima, Norihiko Tsuchiya, Masanori Numano, Yoshihiro Ueno 1998-04-14
5731247 Method for manufacturing a semiconductor device including pre-oxidation process Yoshihiro Ueno, Tsutomu Amai 1998-03-24
5534294 Process for producing Semiconductor silicon wafer Atsuko Kubota, Masakatu Kojima, Norihiko Tsuchiya, Masanori Numano, Yoshihiro Ueno 1996-07-09
5508800 Semiconductor substrate, method of manufacturing semiconductor substrate and semiconductor device, and method of inspecting and evaluating semiconductor substrate Moriya Miyashita, Hachiro Hiratsuka, Atsuko Kubota, Masanori Numano, Hiroyuki Fukui 1996-04-16
5502331 Semiconductor substrate containing bulk micro-defect Yoko Inoue 1996-03-26
5378652 Method of making a through hole in multi-layer insulating films Yuuichi Mikata, Toshiro Usami 1995-01-03
5356830 Semiconductor device and its manufacturing method Susumu Yoshikawa, Satoshi Maeda, Shizuo Sawada 1994-10-18
5291058 Semiconductor device silicon via fill formed in multiple dielectric layers Yuuichi Mikata, Toshiro Usami 1994-03-01
5246500 Vapor phase epitaxial growth apparatus Yoshiaki Matsushita 1993-09-21