Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12116085 | Component for human-powered vehicle | Shota SUYAMA, Satoshi Fujii, Takeshi Ueda, Toshiaki Moriya | 2024-10-15 |
| 11975778 | Information processing apparatus, non-transitory storage medium, and information processing method | Katsuhisa YOSHIKAWA, Yuji Suzuki, Keita Yamazaki, Hiroyuki Ito, Takashi Ogawa +5 more | 2024-05-07 |
| 11900331 | Information processing apparatus, information processing method, and vehicle | Katsuhisa YOSHIKAWA, Yuji Suzuki, Keita Yamazaki, Hiroyuki Ito, Takashi Ogawa +5 more | 2024-02-13 |
| 11642714 | Progressive pressing method, progressive pressing device, manufacturing method for fuel cell separators and manufacturing apparatus for fuel cell separators | Yuichi Hori, Tomotsugu Takahashi, Seitaro Nakamura | 2023-05-09 |
| 11583906 | Manufacturing method for fuel cell separator, and manufacturing apparatus for fuel cell separator | Yuichi Hori, Tomotsugu Takahashi, Seitaro Nakamura | 2023-02-21 |
| 11580583 | Information processing apparatus, information processing system and information processing method | Hiroki Yabushita, Keiichi Kondo, Kaori Takahashi, Jin Xin, Daisuke Mizushima +16 more | 2023-02-14 |
| 11515560 | Progressive pressing device and manufacturing apparatus for fuel cell separators | Yuichi Hori, Tomotsugu Takahashi, Seitaro Nakamura | 2022-11-29 |
| 11444358 | Manufacturing method for fuel cell separators and manufacturing apparatus for fuel cell separators | Yuichi Hori, Tomotsugu Takahashi, Seitaro Nakamura | 2022-09-13 |
| 10873091 | Method for producing porous metal body and method for producing electrode catalyst | Seiichi Kouketsu, Yu Wakakuwa | 2020-12-22 |
| 10666066 | Differential voltage measurement device | Jian Wang, Hironao Fujii | 2020-05-26 |
| 10627450 | Battery state detection device | Hironao Fujii, Jian Wang | 2020-04-21 |
| 9842779 | Method of evaluating metal contamination in semiconductor wafer and method of manufacturing semiconductor wafer | Kazutaka Eriguchi, Noritomo Mitsugi, Tsuyoshi Kubota | 2017-12-12 |
| 9372223 | Method of evaluating metal contamination in semiconductor sample and method of manufacturing semiconductor substrate | Ryuji Ohno | 2016-06-21 |
| 8421435 | Power supply voltage controlling circuit for use in subthreshold digital CMOS circuit including minute current generator and controlled output voltage generator circuit | Tetsuya Hirose, Yuji Osaki | 2013-04-16 |
| 8173523 | Method of removing heavy metal in semiconductor substrate | Noritomo Mitsugi, Masataka Hourai, Shuichi Samata, Kiyoshi Nagai | 2012-05-08 |
| 7893001 | Semiconductor porcelain composition | Takeshi Shimada, Koichi Terao, Kazuya Toji, Kazuhiro Nishikawa | 2011-02-22 |
| 7825054 | Semiconductor porcelain composition | Takeshi Shimada, Koichi Terao, Kazuya Toji, Kazuhiro Nishikawa | 2010-11-02 |
| 7141992 | Method for measuring impurity metal concentration | Ryuuji Ohno | 2006-11-28 |
| 5866468 | Method for fabricating an SOI substrate | Mitsuo Kono | 1999-02-02 |
| 5849603 | Method of processing a surface of a semiconductor substrate | Hirotaka Kato, Yuji Sato | 1998-12-15 |
| 5770511 | Silicon-on-insulator substrate and a method for fabricating the same | Hirotaka Kato, Hiroshi Furukawa | 1998-06-23 |
| 5742175 | Method of evaluating a density of oxygen-precipitation defects in a silicon wafer | Hirotaka Kato | 1998-04-21 |
| 5742176 | Method of measuring a Fe-B concentration of a silicon wafer | Hirotaka Kato | 1998-04-21 |