Ryuji Ohno — 3 Patents at Sumco

Ryuji Ohno has been granted 3 US patents while listed as an inventor at Sumco. The first was granted in 2013 and the most recent in June 2016. Ryuji Ohno ranks #1,328,092 of 4,157,543 US inventors in our database (top 31.9%). Patent records list Ryuji Ohno in Saitama, JP.

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #	Title	Co-Inventors	Date
9372223	Method of evaluating metal contamination in semiconductor sample and method of manufacturing semiconductor substrate	Kei Matsumoto	2016-06-21
8481346	Method of analyzing iron concentration of boron-doped P-type silicon wafer and method of manufacturing silicon wafer	Hisao Iga	2013-07-09
8411263	Method of evaluating silicon wafer and method of manufacturing silicon wafer	Shin Uchino, Masataka Hourai, Yasuo Koike	2013-04-02

Ryuji Ohno — 3 Patents

Issued Patents All Time

Patent Widget