MN

Masanori Numano

KT Kabushiki Kaisha Toshiba: 9 patents #3,402 of 21,451Top 20%
Overall (All Time): #579,948 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDate
8232197 Method of manufacturing a semiconductor device from which damage layers and native oxide films in connection holes have been removed Makoto Honda, Kaori Yomogihara, Kazuhiro Murakami, Takahito Nagamatsu, Hideaki Harakawa +3 more 2012-07-31
7605076 Method of manufacturing a semiconductor device from which damage layers and native oxide films in connection holes have been removed Makoto Honda, Kaori Yomogihara, Kazuhiro Murakami, Takahito Nagamatsu, Hideaki Harakawa +3 more 2009-10-20
6222252 Semiconductor substrate and method for producing the same Moriya Miyashita 2001-04-24
5951755 Manufacturing method of semiconductor substrate and inspection method therefor Moriya Miyashita, Masanobu Ogino, Tadahide Hoshi, Shuichi Samata, Akiko Sekihara +1 more 1999-09-14
5738942 Semiconductor silicon wafer and process for producing it Atsuko Kubota, Masakatu Kojima, Norihiko Tsuchiya, Shuichi Samata, Yoshihiro Ueno 1998-04-14
5739575 Dielectrically isolated substrate and method for manufacturing the same Norihiko Tsuchiya, Hiroyasu Kubota, Yoshiaki Matsushita, Yoshiki Hayashi, Yukihiro Ushiku +4 more 1998-04-14
5675176 Semiconductor device and a method for manufacturing the same Yukihiro Ushiku, Atsushi Yagishita, Satoshi Inaba, Minoru Takahashi, Yoshiki Hayashi +4 more 1997-10-07
5534294 Process for producing Semiconductor silicon wafer Atsuko Kubota, Masakatu Kojima, Norihiko Tsuchiya, Shuichi Samata, Yoshihiro Ueno 1996-07-09
5508800 Semiconductor substrate, method of manufacturing semiconductor substrate and semiconductor device, and method of inspecting and evaluating semiconductor substrate Moriya Miyashita, Hachiro Hiratsuka, Atsuko Kubota, Shuichi Samata, Hiroyuki Fukui 1996-04-16