Issued Patents All Time
Showing 1–25 of 48 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11923167 | Ion implanter and ion implantation method | — | 2024-03-05 |
| 11569058 | Ion implanter and ion implantation method | — | 2023-01-31 |
| 11150611 | Wearable device and time correction method | Mikio Aoki | 2021-10-19 |
| 11062880 | Ion implanter | Ryota Ohnishi | 2021-07-13 |
| 10701344 | Information processing device, information processing system, control method of an information processing device, and parameter setting method | Yasumasa Nakajima, Senichi Mokuya | 2020-06-30 |
| 10490389 | Ion implanter and ion implantation method | Yoshiaki Oogita | 2019-11-26 |
| 10354835 | Ion implanter, ion beam irradiated target, and ion implantation method | — | 2019-07-16 |
| 9967550 | Three-dimensional image processing system, three-dimensional image processing apparatus, and three-dimensional image processing method | — | 2018-05-08 |
| 9929062 | Abnormality portent detection system and method of manufacturing semiconductor device | — | 2018-03-27 |
| 9431214 | Ion implantation apparatus | Mitsuaki Kabasawa, Yoshitaka Amano, Takanori Yagita | 2016-08-30 |
| D753391 | Video camera case | Tomohiro Yasuda | 2016-04-12 |
| 9208991 | Ion implantation apparatus | Mitsuaki Kabasawa, Yoshitaka Amano, Takanori Yagita | 2015-12-08 |
| 9117630 | Insulation structure of high voltage electrodes for ion implantation apparatus | Masateru Sato | 2015-08-25 |
| 8894254 | Luminaire and lamp apparatus housing | Ryotaro Matsuda, Jun Sasaki, Shigeru Osawa, Yuichiro Takahara, Hiromichi Nakajima +7 more | 2014-11-25 |
| 8836919 | Management method and system for exposure apparatus having alarm based on inclination amount and deviation from aligned position | Kenichi Tsujisawa, Takayoshi Otake, Hideyuki Oishi, Akira Ogawa, Koji Washiyama | 2014-09-16 |
| 8764249 | Lamp device and luminaire | Masahiro Toda, Shigeru Osawa, Yuichiro Takahara, Junichi Kimiya | 2014-07-01 |
| 8170707 | Failure detecting method, failure detecting apparatus, and semiconductor device manufacturing method | Kenichi Kadota, Toshiyuki Aritake | 2012-05-01 |
| 8081814 | Linear pattern detection method and apparatus | Kenichi Kadota, Toshiyuki Aritake | 2011-12-20 |
| 7982192 | Beam processing apparatus | Mitsukuni Tsukihara, Mitsuaki Kabasawa, Takanori Yagita, Yoshitaka Amano, Yoshito Fujii | 2011-07-19 |
| 7979154 | Method and system for managing semiconductor manufacturing device | Junji Sugamoto, Masafumi Asano | 2011-07-12 |
| 7970486 | Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus | Junji Sugamoto, Masafumi Asano | 2011-06-28 |
| 7742834 | Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same | Junji Sugamoto, Masafumi Asano | 2010-06-22 |
| 7700381 | Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them | Tsunetoshi Arikado, Masao Iwase, Soichi Nadahara, Yuso Udo, Yukihiro Ushiku +8 more | 2010-04-20 |
| 7687782 | Electrostatic beam deflection scanner and beam deflection scanning method | Mitsukuni Tsukihara, Mitsuaki Kabasawa, Yoshitaka Amano | 2010-03-30 |
| 7599817 | Abnormality cause specifying method, abnormality cause specifying system, and semiconductor device fabrication method | — | 2009-10-06 |