HM

Hiroshi Matsushita

KT Kabushiki Kaisha Toshiba: 19 patents #1,558 of 21,451Top 8%
SC Sumitomo Heavy Industries Ion Technology Co.: 8 patents #5 of 61Top 9%
SE Seiko Epson: 5 patents #2,973 of 7,774Top 40%
SN Sumitomo Eaton Nova: 3 patents #6 of 23Top 30%
NE Nec: 3 patents #4,195 of 14,502Top 30%
ER Eride: 2 patents #6 of 16Top 40%
TT Toshiba Lighting & Technology: 2 patents #203 of 486Top 45%
IBM: 2 patents #32,839 of 70,183Top 50%
Fujitsu Limited: 1 patents #14,843 of 24,456Top 65%
TC Tomoeagawa Paper Co.: 1 patents #110 of 226Top 50%
PA Panasonic: 1 patents #13,264 of 21,108Top 65%
Toshiba Memory: 1 patents #1,210 of 1,971Top 65%
SA Sen Corporation, An Shi And Axcelis: 1 patents #11 of 25Top 45%
SE Sen: 1 patents #18 of 32Top 60%
📍 Ozu, CA: #1 of 2 inventorsTop 50%
Overall (All Time): #57,988 of 4,157,543Top 2%
48
Patents All Time

Issued Patents All Time

Showing 26–48 of 48 patents

Patent #TitleCo-InventorsDate
7529631 Defect detection system, defect detection method, and defect detection program Yasutaka Arakawa, Junji Sugamoto 2009-05-05
7405088 Method for analyzing fail bit maps of waters and apparatus therefor Kenichi Kadota, Kenji Kawabata, Yoshiyuki Shioyama 2008-07-29
7221991 System and method for monitoring manufacturing apparatuses Tomonobu Noda, Kenichi Kadota, Junji Sugamoto, Yukihiro Ushiku 2007-05-22
7222026 Equipment for and method of detecting faults in semiconductor integrated circuits Kunihiro Mitsutake, Yukihiro Ushiku 2007-05-22
7197414 System and method for identifying a manufacturing tool causing a fault Kenichi Kadota 2007-03-27
7162072 Semiconductor processing device, semiconductor processing system and semiconductor processing management method 2007-01-09
7138283 Method for analyzing fail bit maps of wafers Kenichi Kadota 2006-11-21
7138641 Beam deflecting method, beam deflector for scanning, ion implantation method, and ion implantation system Mitsuaki Kabasawa, Yoshitaka Amano, Yasuhiko Kimura, Mitsukuni Tsukihara, Junichi Murakami 2006-11-21
7057259 Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them Tsunetoshi Arikado, Masao Iwase, Soichi Nadahara, Yuso Udo, Yukihiro Ushiku +8 more 2006-06-06
7043384 Failure detection system, failure detection method, and computer program product Kenichi Kadota, Yoshiyuki Shioyama 2006-05-09
6957273 Packet transmitting/receiving method and apparatus for computer system Terumasa Haneda, Makoto Takamatsu, Yuji Hanaoka 2005-10-18
6941109 Computing network path delays so accurate absolute time can be forwarded from a server to a client Paul W. McBurney 2005-09-06
6797968 Ion beam processing method and apparatus therefor Mitsukuni Tsukihara, Yoshitaka Amano, Mitsuaki Kabasawa, Michiro Sugitani, Hiroki Murooka 2004-09-28
6794661 Ion implantation apparatus capable of increasing beam current Mitsukuni Tsukihara, Mitsuaki Kabasawa, Michiro Sugitani, Hiroki Murooka 2004-09-21
6509870 Software-compensated crystal oscillator Paul W. McBurney 2003-01-21
6335648 Circuit using internal pull-up/pull-down resistor during reset 2002-01-01
6320655 Defect-position identifying method for semiconductor substrate Norihiko Tsuchiya, Youko Toyomaru 2001-11-20
6157240 Output logic setting circuit in semiconductor integrated circuit 2000-12-05
6146911 Semiconductor wafer and method of manufacturing the same Norihiko Tsuchiya 2000-11-14
5424675 Full differential type analog circuit having parallel oppositely connected capacitors to eliminate unbalanced parasitic capacitances 1995-06-13
5218585 Phase shifting feedback control in an optical disk drive Henry E. Aviles, Edwin R. Childers, Tetsuya Kokubo, David P. McReynolds, Koichiro Nanke 1993-06-08
5198933 Recording medium emergency release mechanism Koichiro Nanke, Kouji Takahashi 1993-03-30
4933219 Adhesive tapes for die bonding Yukinori Sakumoto, Atsushi Koshimura, Masaki Tsushima 1990-06-12