Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8283940 | Probe device, processing device, and probe testing method | — | 2012-10-09 |
| 7529631 | Defect detection system, defect detection method, and defect detection program | Hiroshi Matsushita, Junji Sugamoto | 2009-05-05 |