| 11378623 |
Diagnostic enhancement for multiple instances of identical structures |
Steven M. Douskey, Mary P. Kusko, Franco Motika, Gerard M. Salem |
2022-07-05 |
| 9274172 |
Selective test pattern processor |
Donato O. Forlenza, Michael P. Grace, Bryan J. Robbins |
2016-03-01 |
| 9274173 |
Selective test pattern processor |
Donato O. Forlenza, Michael P. Grace, Bryan J. Robbins |
2016-03-01 |
| 9244756 |
Logic-built-in-self-test diagnostic method for root cause identification |
Donato O. Forlenza, Bryan J. Robbins |
2016-01-26 |
| 9244757 |
Logic-built-in-self-test diagnostic method for root cause identification |
Donato O. Forlenza, Bryan J. Robbins |
2016-01-26 |
| 8086924 |
Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns |
Donato O. Forlenza, Phong T. Tran |
2011-12-27 |
| 8065575 |
Implementing isolation of VLSI scan chain using ABIST test patterns |
Donato O. Forlenza, Phong T. Tran |
2011-11-22 |
| 7934134 |
Method and apparatus for performing logic built-in self-testing of an integrated circuit |
Donato O. Forlenza, Bryan J. Robbins, Phong T. Tran |
2011-04-26 |
| 7930601 |
AC ABIST diagnostic method, apparatus and program product |
Joseph Eckelman, Donato O. Forlenza, William J. Hurley, Thomas J. Knips, Gary W. Maier +1 more |
2011-04-19 |
| 7921346 |
Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD) |
Donato O. Forlenza, Bryan J. Robbins, Phong T. Tran |
2011-04-05 |
| 7908532 |
Automated system and processing for expedient diagnosis of broken shift registers latch chains |
Joseph Eckelman, Donato O. Forlenza, Robert B. Gass, Phong T. Tran |
2011-03-15 |
| 7475308 |
implementing deterministic based broken scan chain diagnostics |
Adrian C. Anderson, Todd Burdine, Donato O. Forlenza, William J. Hurley, Phong T. Tran |
2009-01-06 |
| 7395469 |
Method for implementing deterministic based broken scan chain diagnostics |
Adrian C. Anderson, Todd Burdine, Donato O. Forlenza, William J. Hurley, Phong T. Tran |
2008-07-01 |
| 7395470 |
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain |
Todd Burdine, Donato O. Forlenza, William J. Hurley, Phong T. Tran |
2008-07-01 |
| 7392449 |
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain |
Todd Burdine, Donato O. Forlenza, William J. Hurley, Phong T. Tran |
2008-06-24 |
| 7234090 |
Method and apparatus for selective scan chain diagnostics |
Charles J. Blasi, Todd Burdine |
2007-06-19 |
| 7225374 |
ABIST-assisted detection of scan chain defects |
Todd Burdine, Donato O. Forlenza, William J. Hurley, Steven Michnowski, James Webb |
2007-05-29 |
| 7117415 |
Automated BIST test pattern sequence generator software system and method |
Donato O. Forlenza, William J. Hurley, Bryan J. Robbins |
2006-10-03 |
| 6308290 |
Look ahead scan chain diagnostic method |
Mary P. Kusko, Franco Motika |
2001-10-23 |
