Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188924 | Methods and systems for analyte detection and analysis | Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov +5 more | 2025-01-07 |
| 11747323 | Methods and systems for analyte detection and analysis | Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov +5 more | 2023-09-05 |
| 11499962 | Methods and systems for analyte detection and analysis | Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov +5 more | 2022-11-15 |
| 10344328 | Methods for biological sample processing and analysis | Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov +5 more | 2019-07-09 |
| 10273528 | Methods and systems for analyte detection and analysis | Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov +5 more | 2019-04-30 |
| 10267790 | Systems for biological sample processing and analysis | Kristopher Barbee, Nathan Beckett, Denis Pristinski, Derek Schulte, Avishai Bartov +5 more | 2019-04-23 |
| 10060884 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Wenjian Cai, Yevgeniy Churin, Ralph Johnson, Meier Brender, Mark Wang +2 more | 2018-08-28 |
| 9970883 | Multi-spot scanning collection optics | Ralph Johnson, Evegeny Churin, Wenjian Cai, Yong-Mo Moon | 2018-05-15 |
| 9891175 | System and method for oblique incidence scanning with 2D array of spots | Yevgeniy Churin | 2018-02-13 |
| 9864173 | Systems and methods for run-time alignment of a spot scanning wafer inspection system | Wenjian Cai, Kai Cao | 2018-01-09 |
| 9645093 | System and method for apodization in a semiconductor device inspection system | Gary Janik, Steve Cui, Rex Runyon, Dieter Wilk, Steve Short +8 more | 2017-05-09 |
| 9546962 | Multi-spot scanning collection optics | Ralph Johnson, Evegeny Churin, Wenjian Cai, Yong-Mo Moon | 2017-01-17 |
| 9395340 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Wenjian Cai, Yevgeniy Churin, Ralph Johnson, Meier Brender, Mark Wang +2 more | 2016-07-19 |
| 9389166 | Enhanced high-speed logarithmic photo-detector for spot scanning system | Ralph C. Wolf, Grace Hsiu-Ling Chen, Kai Cao, Paul Donders, Derek Mackay | 2016-07-12 |
| 9208553 | Image synchronization of scanning wafer inspection system | Kai Cao, Dennis G. Emge, Zhiqin Wang, Wenjian Cai, Henrik Nielsen | 2015-12-08 |
| 9176069 | System and method for apodization in a semiconductor device inspection system | Gary Janik, Steve Cui, Rex Runyon, Dieter Wilk, Steve Short +8 more | 2015-11-03 |
| 8995746 | Image synchronization of scanning wafer inspection system | Kai Cao, Dennis G. Emge, Zhiqin Wang, Wenjian Cai, Henrik Nielsen | 2015-03-31 |
| 7535563 | Systems configured to inspect a specimen | Grace Hsiu-Ling Chen, Tao-Yi Fu, Shing Lee, Greg Kirk | 2009-05-19 |
| 7012683 | Apparatus and methods for optically inspecting a sample for anomalies | Ralph C. Wolf, Eva L. Benitez, Dongsheng (Don) Chen, John D. Greene, Eric Vella +1 more | 2006-03-14 |
| 6922236 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Mehdi Vaez-Iravani, Stan Stokowski, Steven Biellak, Keith Wells, Mehrdad Nikoonahad | 2005-07-26 |
| 6833913 | Apparatus and methods for optically inspecting a sample for anomalies | Ralph C. Wolf, Eva L. Benitez, Dongsheng Chen, John D. Greene, Eric Vella +1 more | 2004-12-21 |
| 6775051 | Systems and methods for scanning a beam of light across a specimen | Ralph Johnson, John Gibson, Mingguang Li, Eric Vella | 2004-08-10 |
| 6686995 | Two-dimensional UV compatible programmable spatial filter | Dieter Wilk, Anlun Tang, Eric Vella, Rex Runyon, Ralph Johnson | 2004-02-03 |
| 6686994 | UV compatible programmable spatial filter | Dieter Wilk, Anlun Tang, Eric Vella, Rex Runyon | 2004-02-03 |