Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10804843 | Photonic degradation monitoring for semiconductor devices | Xiuwen Tu, Michael C. Johnson, Seung Bum Rim, Taiqing Qiu, Yu-Chen Shen +1 more | 2020-10-13 |
| 10476432 | High throughput system for photovoltaic UV degradation testing | Yoann Buratti, Xiuwen Tu, Ryan Manuel Lacerda, Taiqing Qiu | 2019-11-12 |
| 10230329 | Photonic degradation monitoring for semiconductor devices | Xiuwen Tu, Michael C. Johnson, Seung Bum Rim, Taiqing Qiu, Yu-Chen Shen +1 more | 2019-03-12 |
| 9564854 | Photonic degradation monitoring for semiconductor devices | Xiuwen Tu, Michael C. Johnson, Seung Bum Rim, Taiqing Qiu, Yu-Chen Shen +1 more | 2017-02-07 |
| 8427185 | Inline inspection of photovoltaics for electrical defects | George H. Zapalac, Jr., Kirk J. Bertsche, David L. Brown, J. Kirkwood H. Rough, Yehiel Gotkis | 2013-04-23 |
| 8318240 | Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvement | Geordie Zapalac, Bulent M. Basol | 2012-11-27 |
| 8318239 | Method and apparatus for detecting and passivating defects in thin film solar cells | Bulent M. Basol | 2012-11-27 |
| 7906972 | Inline inspection of photovoltaics for electrical defects | George H. Zapalac, Jr., Kirk J. Bertsche, David L. Brown, J. Kirkwood H. Rough, Yehiel Gotkis | 2011-03-15 |
| 7649365 | Inline inspection of photovoltaics for electrical defects | George H. Zapalac, Jr., Kirk J. Bertsche, David L. Brown, J. Kirkwood H. Rough, Yehiel Gotkis | 2010-01-19 |
| 7560703 | Integrated segmented scintillation detector | Ye Yang, Mark Lin, Laurence S. Horndon, Edward G. Solomon, Joseph Anthony Heanue +2 more | 2009-07-14 |
| 7394067 | Systems and methods for reducing alteration of a specimen during analysis for charged particle based and other measurement systems | Paul Wieczorek, Aaron Zuo, Gabor Toth | 2008-07-01 |
| 7304302 | Systems configured to reduce distortion of a resist during a metrology process and systems and methods for reducing alteration of a specimen during analysis | Peter Nunan, Muhran Nasser-Ghodsi, Mark Borowicz, Rudy F. Garcia, Tzu-Chin Chuang +1 more | 2007-12-04 |
| 7148073 | Methods and systems for preparing a copper containing substrate for analysis | Mehran Nasser-Ghodsi, Harold F. Winters, John W. Coburn, Alexander Jozef Gubbens, Gabor Toth | 2006-12-12 |
| 7115866 | Site stepping for electron beam micro analysis | Roger Kroeze, David A. Crewe, Gregory W. Grant, Chiyan Kuan, Thierry H. C. Nguyen +2 more | 2006-10-03 |
| 7049590 | Capping layer to impede atom ejection | — | 2006-05-23 |
| 6936816 | High contrast inspection and review of magnetic media and heads | Marian Mankos, Harald F. Hess | 2005-08-30 |
| 6759654 | High contrast inspection and review of magnetic media and heads | Marian Mankos, Harald F. Hess | 2004-07-06 |