Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8562746 | Sectional wafer carrier | Alexander I. Gurary, Joseph A. Kraus, Ajit Paranjpe, William E. Quinn | 2013-10-22 |
| 7335894 | High current density particle beam system | Juergen Frosien, Stefan Lanio, Gerald Schoenecker, Alan D. Brodie | 2008-02-26 |
| 7205539 | Sample charging control in charged-particle systems | John M. Schmidt | 2007-04-17 |
| 7115866 | Site stepping for electron beam micro analysis | Roger Kroeze, David Aitan Soltz, Gregory W. Grant, Chiyan Kuan, Thierry H. C. Nguyen +2 more | 2006-10-03 |
| 6633034 | Method and apparatus for imaging a specimen using low profile electron detector for charged particle beam imaging apparatus including electrostatic mirrors | — | 2003-10-14 |