Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7394067 | Systems and methods for reducing alteration of a specimen during analysis for charged particle based and other measurement systems | David Aitan Soltz, Aaron Zuo, Gabor Toth | 2008-07-01 |
| 5502306 | Electron beam inspection system and method | Dan Meisburger, Alan D. Brodie, Curt H. Chadwick, Anil Desai, Hans-Peter Dohse +28 more | 1996-03-26 |