MD

Mark L. Doczy

IN Intel: 203 patents #53 of 30,777Top 1%
PS Planar Systems: 1 patents #37 of 88Top 45%
TR Tahoe Research: 1 patents #81 of 215Top 40%
📍 Portland, OR: #26 of 9,213 inventorsTop 1%
🗺 Oregon: #51 of 28,073 inventorsTop 1%
Overall (All Time): #3,156 of 4,157,543Top 1%
206
Patents All Time

Issued Patents All Time

Showing 101–125 of 206 patents

Patent #TitleCo-InventorsDate
7709909 Method for making a semiconductor device having a high-k gate dielectric Gilbert Dewey, Suman Datta, Sangwoo Pae, Justin K. Brask, Jack T. Kavalieros +4 more 2010-05-04
7704833 Method of forming abrupt source drain metal gate transistors Nick Lindert, Suman Datta, Jack T. Kavalieros, Matthew V. Metz, Justin K. Brask +3 more 2010-04-27
7682891 Tunable gate electrode work function material for transistor applications Adrien LaVoie, Valery M. Dubin, John J. Plombon, Juan E. Dominguez, Harsono S. Simka +1 more 2010-03-23
7671471 Method for making a semiconductor device having a high-k dielectric layer and a metal gate electrode Justin K. Brask, Jack T. Kavalieros, Uday Shah, Chris Barns, Matthew V. Metz +3 more 2010-03-02
7666727 Semiconductor device having a laterally modulated gate workfunction and method of fabrication Brian S. Doyle, Scott A. Hareland, Robert S. Chau 2010-02-23
7615441 Forming high-k dielectric layers on smooth substrates Justin K. Brask, Jack T. Kavalieros, Matthew V. Metz, Suman Datta, Uday Shah +2 more 2009-11-10
7575991 Removing a high-k gate dielectric Robert Norman, Justin K. Brask, Jack T. Kavalieros, Matthew V. Metz, Suman Datta +1 more 2009-08-18
7569443 Complementary metal oxide semiconductor integrated circuit using raised source drain and replacement metal gate Jack T. Kavalieros, Annalisa Cappellani, Justin K. Brask, Matthew V. Metz, Suman Datta +2 more 2009-08-04
7531437 Method of forming metal gate electrodes using sacrificial gate electrode material and sacrificial gate dielectric material Justin K. Brask, Brian S. Doyle, Jack T. Kavalieros, Uday Shah, Robert S. Chau 2009-05-12
7528025 Nonplanar transistors with metal gate electrodes Justin K. Brask, Brian Dovle, Jack Kavalleros, Uday Shah, Robert S. Chau 2009-05-05
7524727 Gate electrode having a capping layer Gilbert Dewey, Suman Datta, Justin K. Brask, Matthew V. Metz 2009-04-28
7518196 Field effect transistor with narrow bandgap source and drain regions and method of fabrication Robert S. Chau, Suman Datta, Jack T. Kavalieros, Justin K. Brask, Matthew V. Metz 2009-04-14
7501336 Metal gate device with reduced oxidation of a high-k gate dielectric Brian S. Doyle, Jack T. Kavalieros, Justin K. Brask, Matthew V. Mertz, Suman Datta +1 more 2009-03-10
7485503 Dielectric interface for group III-V semiconductor device Justin K. Brask, Suman Datta, James M. Blackwell, Matthew V. Metz, Jack T. Kavalieros +1 more 2009-02-03
7479421 Process for integrating planar and non-planar CMOS transistors on a bulk substrate and article made thereby Jack T. Kavalieros, Justin K. Brask, Brian S. Doyle, Uday Shah, Suman Datta +2 more 2009-01-20
7470972 Complementary metal oxide semiconductor integrated circuit using uniaxial compressive stress and biaxial compressive stress Jack T. Kavalieros, Justin K. Brask, Matthew V. Metz, Suman Datta, Brian S. Doyle +7 more 2008-12-30
7449756 Semiconductor device with a high-k gate dielectric and a metal gate electrode Matthew V. Metz, Suman Datta, Justin K. Brask, Jack T. Kavalieros, Robert S. Chau 2008-11-11
7442983 Method for making a semiconductor device having a high-k gate dielectric Gilbert Dewey, Suman Datta, Sangwoo Pae, Justin K. Brask, Jack T. Kavalieros +4 more 2008-10-28
7439571 Method for fabricating metal gate structures Mark Liu, Jack T. Kavalieros, Justin K. Brask, Matthew V. Metz, Robert S. Chau 2008-10-21
7439113 Forming dual metal complementary metal oxide semiconductor integrated circuits Mitchell Taylor, Justin K. Brask, Jack T. Kavalieros, Suman Datta, Matthew V. Metz +2 more 2008-10-21
7429747 Sb-based CMOS devices Mantu K. Hudait, Suman Datta, Jack T. Kavalieros, Robert S. Chau 2008-09-30
7425490 Reducing reactions between polysilicon gate electrodes and high dielectric constant gate dielectrics Jack T. Kavalieros, Justin K. Brask, Uday Shah, Matthew V. Metz, Suman Datta +1 more 2008-09-16
7425500 Uniform silicide metal on epitaxially grown source and drain regions of three-dimensional transistors Matthew V. Metz, Suman Datta, Jack T. Kavalieros, Justin K. Brask, Robert S. Chau 2008-09-16
7422936 Facilitating removal of sacrificial layers via implantation to form replacement metal gates Chris Barns, Matt Prince, Justin K. Brask, Jack T. Kavalieros 2008-09-09
7420254 Semiconductor device having a metal gate electrode Robert S. Chau, Markus Kuhn 2008-09-02