VB

Veeraraghavan S. Basker

IBM: 426 patents #36 of 70,183Top 1%
Globalfoundries: 26 patents #104 of 4,424Top 3%
TE Tessera: 7 patents #62 of 271Top 25%
RE Renesas Electronics: 3 patents #1,322 of 4,529Top 30%
GU Globalfoundries U.S.: 3 patents #206 of 665Top 35%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
SS Stmicroelectronics Sa: 1 patents #938 of 1,676Top 60%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
📍 Schenectady, NY: #3 of 1,353 inventorsTop 1%
🗺 New York: #25 of 115,490 inventorsTop 1%
Overall (All Time): #452 of 4,157,543Top 1%
462
Patents All Time

Issued Patents All Time

Showing 126–150 of 462 patents

Patent #TitleCo-InventorsDate
10361307 Contact structure and extension formation for III-V nFET Alexander Reznicek 2019-07-23
10347765 Split fin field effect transistor enabling back bias on fin type field effect transistors Zuoguang Liu, Xin Miao, Tenko Yamashita 2019-07-09
10332796 Fin pitch scaling for high voltage devices and low voltage devices on the same wafer Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-06-25
10326000 FinFET with reduced parasitic capacitance Emre Alptekin, Sivananda K. Kanakasabapathy 2019-06-18
10325999 Contact area to trench silicide resistance reduction by high-resistance interface removal Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-06-18
10319840 Fin field effect transistor fabrication and devices having inverted T-shaped gate Zuoguang Liu, Tenko Yamashita, Chun-Chen Yeh 2019-06-11
10319640 FinFET devices Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-06-11
10312377 Localized fin width scaling using a hydrogen anneal Shogo Mochizuki, Tenko Yamashita, Chun-Chen Yeh 2019-06-04
10312318 Metal-insulator-metal capacitor structure Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-06-04
10304941 Replacement metal gate structures Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-05-28
10297689 Precise control of vertical transistor gate length Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-05-21
10297614 Gate top spacer for FinFET Oleg Gluschenkov, Shogo Mochizuki, Alexander Reznicek 2019-05-21
10297448 SiGe fins formed on a substrate Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-05-21
10290633 CMOS compatible fuse or resistor using self-aligned contacts Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-05-14
10283406 Fabrication of self-aligned gate contacts and source/drain contacts directly above gate electrodes and source/drains Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-05-07
10283586 Capacitors Kangguo Cheng, Christopher J. Penny, Theodorus E. Standaert, Junli Wang 2019-05-07
10276658 FinFET devices Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-04-30
10269644 Fin pitch scaling for high voltage devices and low voltage devices on the same wafer Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-04-23
10256327 Forming a fin using double trench epitaxy Pouya Hashemi, Shogo Mochizuki, Alexander Reznicek 2019-04-09
10249537 Method and structure for forming FinFET CMOS with dual doped STI regions Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-04-02
10249536 Semiconductor fins for FinFET devices and sidewall image transfer (SIT) processes for manufacturing the same Kangguo Cheng, Theodorus E. Standaert 2019-04-02
10236380 Precise control of vertical transistor gate length Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-03-19
10236359 Replacement metal gate structures Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-03-19
10236293 FinFET CMOS with silicon fin N-channel FET and silicon germanium fin P-channel FET Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-03-19
10236289 Approach to fabrication of an on-chip resistor with a field effect transistor Kangguo Cheng, Theodorus E. Standaert, Junli Wang 2019-03-19