TF

Toshiharu Furukawa

IBM: 278 patents #88 of 70,183Top 1%
TO Toyota: 3 patents #8,352 of 26,838Top 35%
SC Sekisui Chemical Co.: 2 patents #358 of 908Top 40%
DT Daido Tokushuko: 1 patents #152 of 382Top 40%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
TC Tomoeagawa Paper Co.: 1 patents #110 of 226Top 50%
📍 South Burlington, VT: #3 of 1,136 inventorsTop 1%
🗺 Vermont: #7 of 4,968 inventorsTop 1%
Overall (All Time): #1,485 of 4,157,543Top 1%
286
Patents All Time

Issued Patents All Time

Showing 201–225 of 286 patents

Patent #TitleCo-InventorsDate
6656807 Grooved planar DRAM transfer device using buried pocket Gary B. Bronner, Mark C. Hakey, Steven J. Holmes, David V. Horak, Jack A. Mandelman 2003-12-02
6635543 SOI hybrid structure with selective epitaxial growth of silicon Jack A. Mandelman, Dan Moy, Byeongju Park, William R. Tonti 2003-10-21
6620675 Increased capacitance trench capacitor Mark C. Hakey, Steven J. Holmes, William H. Ma 2003-09-16
6614074 Grooved planar DRAM transfer device using buried pocket Gary B. Bronner, Mark C. Hakey, Steven J. Holmes, David V. Horak, Jack A. Mandelman 2003-09-02
6596570 SOI device with reduced junction capacitance 2003-07-22
6596597 Method of manufacturing dual gate logic devices Mark C. Hakey, Steven J. Holmes, David V. Horak, William H. Ma 2003-07-22
6583462 Vertical DRAM having metallic node conductor Rajarao Jammy, Thomas S. Kanarsky, Jeffrey J. Welser, David V. Horak, Steven J. Holmes +1 more 2003-06-24
6555891 SOI hybrid structure with selective epitaxial growth of silicon Jack A. Mandelman, Dan Moy, Byeongju Park, William R. Tonti 2003-04-29
6531379 High resolution dopant/impurity incorporation in semiconductors via a scanned atomic force probe John J. Ellis-Monaghan, James A. Slinkman 2003-03-11
6531724 Borderless gate structures Mark C. Hakey, Steven J. Holmes, David V. Horak, Paul A. Rabidoux 2003-03-11
6514840 Micro heating of selective regions Howard T. Barrett, Donald W. Rakowski, James A. Slinkman 2003-02-04
6509611 Method for wrapped-gate MOSFET Byeongju Park, Jack A. Mandelman 2003-01-21
6506660 Semiconductor with nanoscale features Steven J. Holmes, Charles T. Black, David J. Frank, Mark C. Hakey, David V. Horak +3 more 2003-01-14
6506653 Method using disposable and permanent films for diffusion and implant doping Mark C. Hakey, Steven J. Holmes, David V. Horak, William H. Ma, Patricia Marmillion +1 more 2003-01-14
6489207 Method of doping a gate and creating a very shallow source/drain extension and resulting semiconductor Mark C. Hakey, Steven J. Holmes, David V. Horak 2002-12-03
6452265 Multi-chip module utilizing a nonconductive material surrounding the chips that has a similar coefficient of thermal expansion Mark C. Hakey, Steven J. Holmes, David V. Horak, Rosemary A. Previti-Kelly, Edmund J. Sprogis 2002-09-17
6444402 Method of making differently sized vias and lines on the same lithography level Mark C. Hakey, Steven J. Holmes, David V. Horak, William H. Ma 2002-09-03
6441464 Gate oxide stabilization by means of germanium components in gate conductor Steven J. Holmes, Mark C. Hakey, David V. Horak 2002-08-27
6440801 Structure for folded architecture pillar memory cell Mark C. Hakey, Steven J. Holmes, David V. Horak, Howard L. Kalter, Jack A. Mandelman +2 more 2002-08-27
6429080 Multi-level dram trench store utilizing two capacitors and two plates David V. Horak, Howard L. Kalter 2002-08-06
6429045 Structure and process for multi-chip chip attach with reduced risk of electrostatic discharge damage Mark C. Hakey, Steven J. Holmes, David V. Horak, H. Bernhard Pogge, Edmund J. Sprogis +1 more 2002-08-06
6426305 Patterned plasma nitridation for selective epi and silicide formation Anthony I. Chou, Akihisa Sekiguchi 2002-07-30
6426175 Fabrication of a high density long channel DRAM gate with or without a grooved gate Mark C. Hakey, Stevn J. Holmes, David V. Horak, Paul A. Rabidoux 2002-07-30
6417515 In-situ ion implant activation and measurement apparatus Howard T. Barrett, John J. Ellis-Monaghan, James A. Slinkman 2002-07-09
6396120 Silicon anti-fuse structures, bulk and silicon on insulator fabrication methods and application Claude L. Bertin, Erik L. Hedberg, Jack A. Mandelman, William R. Tonti, Richard Q. Williams 2002-05-28