NS

Nakgeuon Seong

IBM: 9 patents #11,918 of 70,183Top 20%
CY Cymer: 2 patents #138 of 339Top 45%
📍 Wappingers Falls, NY: #183 of 884 inventorsTop 25%
🗺 New York: #13,384 of 115,490 inventorsTop 15%
Overall (All Time): #464,029 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
9207119 Active spectral control during spectrum synthesis Rostislav Rokitski, Kevin M. O'Brien 2015-12-08
8520186 Active spectral control of optical source Ivan Lalovic, Nigel R. Farrar, Robert Jay Rafac, Joseph J. Bendik 2013-08-27
8473885 Physical design system and method John M. Cohn, James A. Culp, Ulrich A. Finkler, Fook-Luen Heng, Mark A. Lavin +6 more 2013-06-25
8238644 Fast method to model photoresist images using focus blur and resist blur Timothy A. Brunner, Gregg M. Gallatin, Ronald Gordon, Kafai Lai, Alan E. Rosenbluth 2012-08-07
8219943 Physical design system and method John M. Cohn, James A. Culp, Ulrich A. Finkler, Fook-Luen Heng, Mark A. Lavin +6 more 2012-07-10
7605447 Highly manufacturable SRAM cells in substrates with hybrid crystal orientation Bruce B. Doris, Gregory Costrini, Oleg Gluschenkov, Meikei Ieong 2009-10-20
7536664 Physical design system and method John M. Cohn, James A. Culp, Ulrich A. Finkler, Fook-Luen Heng, Mark A. Lavin +6 more 2009-05-19
7269817 Lithographic process window optimization under complex constraints on edge placement Fook-Luen Heng, Mark A. Lavin, Jin-Fuw Lee, Daniel L. Ostapko, Alan E. Rosenbluth 2007-09-11
7079223 Fast model-based optical proximity correction Alan E. Rosenbluth, Gregg M. Gallatin, Ronald Gordon, Alexey Y. Lvov, William D. Hinsberg +3 more 2006-07-18
6919146 Planar reticle design/fabrication method for rapid inspection and cleaning Daniel A. Corliss, Christopher J. Progler 2005-07-19
6842237 Phase shifted test pattern for monitoring focus and aberrations in optical projection systems Christopher P. Ausschnitt, Timothy A. Brunner, Joseph P. Kirk 2005-01-11