Issued Patents All Time
Showing 76–88 of 88 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6916698 | High performance CMOS device structure with mid-gap metal gate | Anda C. Mocuta, Ricky S. Amos, Diane C. Boyd, Dan M. Mocuta, Huajie Chen | 2005-07-12 |
| 6914303 | Ultra thin channel MOSFET | Bruce B. Doris, Thomas S. Kanarsky, Ying Zhang, Huilong Zhu, Omer H. Dokumaci | 2005-07-05 |
| 6911383 | Hybrid planar and finFET CMOS devices | Bruce B. Doris, Diane C. Boyd, Thomas S. Kanarsky, Jakub Kedzierski, Min Yang | 2005-06-28 |
| 6905941 | Structure and method to fabricate ultra-thin Si channel devices | Bruce B. Doris, Thomas S. Kanarsky, Wesley C. Natzle | 2005-06-14 |
| 6833569 | Self-aligned planar double-gate process by amorphization | Omer H. Dokumaci, Bruce B. Doris, Suryanarayan G. Hegde, Erin C. Jones | 2004-12-21 |
| 6830962 | Self-aligned SOI with different crystal orientation using wafer bonding and SIMOX processes | Kathryn Guarini, Leathen Shi, Min Yang | 2004-12-14 |
| 6821826 | Three dimensional CMOS integrated circuits having device layers built on different crystal oriented wafers | Victor Chan, Kathryn Guarini | 2004-11-23 |
| 6815278 | Ultra-thin silicon-on-insulator and strained-silicon-direct-on-insulator with hybrid crystal orientations | Min Yang | 2004-11-09 |
| 6762469 | High performance CMOS device structure with mid-gap metal gate | Anda C. Mocuta, Ricky S. Amos, Diane C. Boyd, Dan M. Mocuta, Huajie Chen | 2004-07-13 |
| 6677646 | Method and structure of a disposable reversed spacer process for high performance recessed channel CMOS | Omer H. Dokumaci, Thomas S. Kanarsky, Victor Ku | 2004-01-13 |
| 6492212 | Variable threshold voltage double gated transistors and method of fabrication | Edward J. Nowak | 2002-12-10 |
| 6353249 | MOSFET with high dielectric constant gate insulator and minimum overlap capacitance | Diane C. Boyd, Hussein I. Hanafi, Wesley C. Natzle | 2002-03-05 |
| 6271094 | Method of making MOSFET with high dielectric constant gate insulator and minimum overlap capacitance | Diane C. Boyd, Hussein I. Hanafi, Wesley C. Natzle | 2001-08-07 |