Issued Patents All Time
Showing 26–50 of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10515183 | Integrated circuit identification | Andrea Bahgat Shehata, Peilin Song | 2019-12-24 |
| 10429433 | Method for the characterization and monitoring of integrated circuits | Raphael P. Robertazzi, Peilin Song | 2019-10-01 |
| 10386409 | Non-destructive determination of components of integrated circuits | Lynne M. Gignac, Chung-Ching Lin | 2019-08-20 |
| 10379152 | Method for the characterization and monitoring of integrated circuits | Raphael P. Robertazzi, Peilin Song | 2019-08-13 |
| 10302697 | Automated scan chain diagnostics using emission | Peilin Song | 2019-05-28 |
| 10147175 | Detection of hardware trojan using light emissions with sacrificial mask | Andrea Bahgat Shehata, Peilin Song, Alan J. Weger | 2018-12-04 |
| 10102090 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more | 2018-10-16 |
| 9939486 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Dirk Pfeiffer, Thomas M. Shaw, Peilin Song | 2018-04-10 |
| 9930325 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Alan J. Weger | 2018-03-27 |
| 9874601 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Dirk Pfeiffer, Thomas M. Shaw, Peilin Song | 2018-01-23 |
| 9830702 | Dynamic real-time layout overlay | — | 2017-11-28 |
| 9678152 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Alan J. Weger, Peilin Song | 2017-06-13 |
| 9632136 | Precise estimation of arrival time of switching events close in time and space | — | 2017-04-25 |
| 9581642 | Method and system for quickly identifying circuit components in an emission image | Peilin Song | 2017-02-28 |
| 9568540 | Method for the characterization and monitoring of integrated circuits | Raphael P. Robertazzi, Peilin Song | 2017-02-14 |
| 9557369 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Dirk Pfeiffer, Thomas M. Shaw, Peilin Song | 2017-01-31 |
| 9448277 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Dirk Pfeiffer, Thomas M. Shaw, Peilin Song | 2016-09-20 |
| 9372231 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Alan J. Weger, Peilin Song | 2016-06-21 |
| 9261561 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Alan J. Weger, Peilin Song | 2016-02-16 |
| 9229044 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Alan J. Weger | 2016-01-05 |
| 9086457 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Alan J. Weger, Peilin Song | 2015-07-21 |
| 9081049 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Alan J. Weger | 2015-07-14 |
| 9075106 | Detecting chip alterations with light emission | Kerry Bernstein, James A. Culp, David F. Heidel, Dirk Pfeiffer, Anthony D. Polson +2 more | 2015-07-07 |
| 8750595 | Registering measured images to layout data | — | 2014-06-10 |
| 8635582 | Navigating analytical tools using layout software | Peilin Song | 2014-01-21 |