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USPTO Patent Rankings Data through Dec 31, 2025
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Jifeng Chen — 12 Patents

IBM: 4 patents #21,783 of 70,183Top 35%
SCShanghai United Imaging Healthcare Co.: 2 patents #274 of 598Top 50%
WCWuhan China Star Optoelectronics Semiconductor Display Technology Co.: 2 patents #274 of 623Top 45%
GE: 2 patents #13,632 of 36,430Top 40%
NUNxp Usa: 1 patents #1,089 of 2,066Top 55%
WCWuhan United Imaging Healthcare Co.: 1 patents #11 of 32Top 35%
Overall (All Time): #396,045 of 4,157,543Top 10%
12 Patents All Time
Jifeng Chen has been granted 12 US patents while listed as an inventor at IBM. The first was granted in 2016 and the most recent in April 2025. Jifeng Chen ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list Jifeng Chen in Shanghai, CT, CN.

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12270875 Systems and methods for improving output stability of a radio frequency power amplifier by gain compensation and correction Peng Zhang, Hui Zhu, Xu Chu, Bin Cao, Yinqi WANG 2025-04-08
11863219 Radio frequency power amplifier control device Bin Cao, Xu Chu, Peng Zhang, Yinqi WANG 2024-01-02
11165453 Radio frequency power amplifier control device Bin Cao, Xu Chu, Peng Zhang, Yinqi WANG 2021-11-02
11127923 Display device Bao Chen 2021-09-21
10833135 Flexible organic light emitting diode display device and method of fabricating same Yongzhen Jia 2020-11-10
10833387 Magnetic resonance imaging device, power amplifier module and power combiner Tingting Song 2020-11-10
10209327 Magnetic resonance imaging apparatus, radio frequency amplification system and method Tingting Song, Xin Jiang 2019-02-19 $19,455,000
10084437 Power supply noise sensor Dat T. Tran, Anis M. Jarrar, Jorge Arturo Corso, LeRoy Winemberg, Balaji Rajasekaran 2018-09-25 $33,025,000
9939486 Integrated time dependent dielectric breakdown reliability testing Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari 2018-04-10 $2,135,000
9874601 Integrated time dependent dielectric breakdown reliability testing Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari 2018-01-23 $4,886,000
9557369 Integrated time dependent dielectric breakdown reliability testing Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari 2017-01-31 $3,813,000
9448277 Integrated time dependent dielectric breakdown reliability testing Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari 2016-09-20 $4,565,000

Nearby-Ranked Inventors

John Patrick Hickey, III12
Gregory Lutter12
Josselin Xavier COUPARD12
Xuan Li12
Nandana Mihindukulasooriya12
Keiichi Matsuda12
Robert Imig12
Peter Mage12
Sze Ping Ching12