Issued Patents All Time
Showing 51–69 of 69 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8412993 | Self-adjusting critical path timing of multi-core VLSI chip | Peilin Song | 2013-04-02 |
| 8331726 | Creating emission images of integrated circuits | Peilin Song | 2012-12-11 |
| 8312413 | Navigating analytical tools using layout software | Peilin Song | 2012-11-13 |
| 8193009 | Apparatus and methods for packaging electronic devices for optical testing | Alberto Tosi, Peilin Song | 2012-06-05 |
| 8131056 | Constructing variability maps by correlating off-state leakage emission images to layout information | Stanislav Polonsky, Peilin Song, Alan J. Weger | 2012-03-06 |
| 8115170 | Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system | Alberto Tosi, Franco Zappa, Peilin Song | 2012-02-14 |
| 8041437 | System and method for virtual control of laboratory equipment | Steven E. Steen, Peilin Song | 2011-10-18 |
| 7927898 | Apparatus and methods for packaging electronic devices for optical testing | Alberto Tosi, Peilin Song | 2011-04-19 |
| 7868606 | Process variation on-chip sensor | Mesut Meterelliyoz, Peilin Song | 2011-01-11 |
| 7788058 | Method and apparatus for diagnosing broken scan chain based on leakage light emission | Peilin Song, Tian Xia, Alan J. Weger, Stanislav Polonsky | 2010-08-31 |
| 7635904 | Apparatus and methods for packaging electronic devices for optical testing | Alberto Tosi, Peilin Song | 2009-12-22 |
| 7612571 | System and method for estimation of integrated circuit signal characteristics using optical measurements | Alberto Tosi, Peilin Song | 2009-11-03 |
| 7480882 | Measuring and predicting VLSI chip reliability and failure | Peilin Song, David F. Heidel, Franco Motika | 2009-01-20 |
| 7446550 | Enhanced signal observability for circuit analysis | Chandler McDowell, Stanislav Polonsky, Peilin Song, Alan J. Weger | 2008-11-04 |
| 7426448 | Method and apparatus for diagnosing broken scan chain based on leakage light emission | Peilin Song, Tian Xia, Alan J. Weger, Stanislav Polonsky | 2008-09-16 |
| 7378859 | System and method for estimation of integrated circuit signal characteristics using optical measurements | Alberto Tosi, Peilin Song | 2008-05-27 |
| 7355419 | Enhanced signal observability for circuit analysis | Chandler McDowell, Stanislav Polonsky, Peilin Song, Alan J. Weger | 2008-04-08 |
| 7239157 | Optical trigger for PICA technique | Peilin Song | 2007-07-03 |
| 7154287 | Method and apparatus for light-controlled circuit characterization | Peilin Song | 2006-12-26 |