Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
DG

David L. Gardell

IBM: 36 patents #2,696 of 70,183Top 4%
Globalfoundries: 5 patents #673 of 4,424Top 20%
Saint Albans, VT: #2 of 84 inventorsTop 3%
Vermont: #159 of 4,968 inventorsTop 4%
Overall (All Time): #73,376 of 4,157,543Top 2%
42 Patents All Time

Issued Patents All Time

Showing 26–42 of 42 patents

Patent #TitleCo-InventorsDate
7259580 Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test Paul J. Aube, Normand Cote, Roger Gamache, Paul M. Gaschke, Marc D. Knox +1 more 2007-08-21
7084651 Probe card assembly David M. Audette, John F. Hagios, Christopher Sullivan 2006-08-01
6911836 Apparatus for functional and stress testing of exposed chip land grid array devices Lonnie J. Cannon, John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Jeffrey Frank Kutner, Kenneth Carl Larsen +2 more 2005-06-28
6720789 Method for wafer test and wafer test system for implementing the method David M. Audette, John F. Hagios 2004-04-13
6590404 Force and centrality measuring tool Edward J. Sukuskas 2003-07-08
6577146 Method of burning in an integrated circuit chip package Roger Gamache, Marc D. Knox 2003-06-10
6504392 Actively controlled heat sink for convective burn-in oven John A. Fredeman, Marc D. Knox, Mark R. LaForce 2003-01-07
6351134 Semiconductor wafer test and burn-in James M. Leas, Robert William Koss, Jody Van Horn, George F. Walker, Charles H. Perry +2 more 2002-02-26
6275051 Segmented architecture for wafer test and burn-in Thomas W. Bachelder, Dennis R. Barringer, Dennis R. Conti, James M. Crafts, Paul M. Gaschke +5 more 2001-08-14
6173760 Co-axial bellows liquid heatsink for high power module test Krisztian Gaspar, Guy Morin 2001-01-16
6086387 Cover assembly for a socket adaptable to IC modules of varying thickness used for burn-in testing Ethan E. Gallagher, Paul M. Gaschke 2000-07-11
6050326 Method and apparatus for cooling an electronic device Richard J. Evans, Anthony M. Palagonia 2000-04-18
6012020 Apparatus and method for monitoring the condition of septic tanks Steven E. Gardell, Eric W Gardell 2000-01-04
5929651 Semiconductor wafer test and burn-in James M. Leas, Robert William Koss, Jody Van Horn, George F. Walker, Charles H. Perry +2 more 1999-07-27
5628889 High power capacity magnetron cathode David C. Strippe 1997-05-13
5585600 Encapsulated semiconductor chip module and method of forming the same Francis E. Froebel, Gary H. Irish, Mohammed S. Shaikh 1996-12-17
5252062 Thermal processing furnace Robert F. Groves, Lynda L. Eaton, Paul H. Boileau 1993-10-12