Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7550303 | Systems and methods for overlay shift determination | Patricia Argandona, Faisal Azam, Helen Wang | 2009-06-23 |
| 7475368 | Deflection analysis system and method for circuit design | Matthew S. Angyal, Giovanni Fiorenza, Habib Hichri, Dale Curtis McHerron, Conal E. Murray | 2009-01-06 |
| 7084427 | Systems and methods for overlay shift determination | Patricia Argandona, Faisal Azam, Helen Wang | 2006-08-01 |
| 6927472 | Fuse structure and method to form the same | David K. Anderson, Tien-Jen Cheng, Timothy J. Dalton, Christopher V. Jahnes, Chandrasekhar Narayan +3 more | 2005-08-09 |
| 6924185 | Fuse structure and method to form the same | David K. Anderson, Tien-Jen Cheng, Timothy J. Dalton, Christopher V. Jahnes, Chandrasekhar Narayan +3 more | 2005-08-02 |
| 6908830 | Method for printing marks on the edges of wafers | Donald M. Odiwo, Roger J. Yerdon | 2005-06-21 |
| 6803668 | Process-robust alignment mark structure for semiconductor wafers | Karen L. Holloway, Qiang Wu | 2004-10-12 |
| 6372647 | Via masked line first dual damascene | Juan A. Chediak | 2002-04-16 |