TO

Takashi Ohshima

HH Hitachi High-Technologies: 39 patents #45 of 1,917Top 3%
HI Hitachi: 7 patents #5,859 of 28,497Top 25%
SE Senqcia: 6 patents #4 of 22Top 20%
TI Takasago International: 4 patents #105 of 465Top 25%
AA Autoliv Development Ab: 2 patents #289 of 1,363Top 25%
KU Kyushu University, National University: 1 patents #221 of 767Top 30%
RI Riken: 1 patents #679 of 1,824Top 40%
HT Hitachi Metals Techno: 1 patents #5 of 13Top 40%
Fujitsu Limited: 1 patents #14,843 of 24,456Top 65%
AT Agency Of Industrial Science And Technology: 1 patents #568 of 1,778Top 35%
TT The University Of Tokyo: 1 patents #1,000 of 2,633Top 40%
Canon: 1 patents #14,899 of 19,416Top 80%
Overall (All Time): #33,262 of 4,157,543Top 1%
65
Patents All Time

Issued Patents All Time

Showing 26–50 of 65 patents

Patent #TitleCo-InventorsDate
9508527 Sample base, charged particle beam device and sample observation method Yusuke Ominami, Sukehiro Ito 2016-11-29
9355815 Electron microscope and electron beam detector Shin Imamura, Yoichi Ose, Kenichi Hirane 2016-05-31
D754369 Free access floor panel Atsuhiko Kobayashi, Tsukasa Matsuzaki, Yuichi Nakabo 2016-04-19
D754368 Free access floor panel Atsuhiko Kobayashi, Tsukasa Matsuzaki, Yuichi Nakabo 2016-04-19
9278905 Production method for compound comprising amino group and/or hydroxyl group Hiroyuki Morimoto, Yuhei Shimizu 2016-03-08
9208995 Charged particle beam apparatus Yusuke Ominami, Hiroyuki Ito, Mitsugu Sato, Sukehiro Ito 2015-12-08
D745193 Lid for opening portion of free access floor panel Atsuhiko Kobayashi, Tsukasa Matsuzaki, Yuichi Nakabo 2015-12-08
9208994 Electron beam apparatus for visualizing a displacement of an electric field Michio Hatano, Hideo Morishita 2015-12-08
9202667 Charged particle radiation device with bandpass detection Michio Hatano, Tetsuya Sawahata, Yasuko Watanabe, Mitsugu Sato, Sukehiro Ito +1 more 2015-12-01
9029766 Scanning electron microscope Hideo Morishita, Michio Hatano, Sukehiro Ito 2015-05-12
8866371 Electric field discharge-type electron source Souichi Katagiri, Sukehiro Ito 2014-10-21
8772735 Charged particle beam apparatus, and method of controlling the same Keigo Kasuya, Souichi Katagiri, Shigeru Kokubo, Hideo Todokoro 2014-07-08
8714585 Knee airbag Masakazu Okamoto, Akifumi Hanawa 2014-05-06
8686380 Charged particle beam apparatus Souichi Katagiri, Sho Takami, Makoto Ezumi, Takashi Doi, Yuji Kasai 2014-04-01
8651513 Airbag Masakazu Okamoto, Akifumi Hanawa 2014-02-18
8629395 Charged particle beam apparatus Hideo Morishita, Michio Hatano, Mitsugu Sato, Tetsuya Sawahata, Sukehiro Ito +1 more 2014-01-14
8530865 Gas field ion source, charged particle microscope, and apparatus Hiroyasu Shichi, Shinichi Matsubara, Satoshi Tomimatsu, Tomihiro Hashizume, Tohru Ishitani 2013-09-10
8450699 Electron beam device and electron beam application device using the same Satoshi Tomimatsu 2013-05-28
8431709 Acylation reaction of hydroxyl group Kazushi Mashima, Takanori Iwasaki, Noboru Sayo 2013-04-30
8426835 Charged particle radiation device Keigo Kasuya, Souichi Katagiri, Masashi Kimura 2013-04-23
8319193 Charged particle beam apparatus, and method of controlling the same Keigo Kasuya, Souichi Katagiri, Shigeru Kokubo, Hideo Todokoro 2012-11-27
8232712 Small electron gun Soichi Katagiri 2012-07-31
8217363 Scanning electron microscope Michio Hatano, Mitsugu Sato 2012-07-10
8115184 Gas field ion source, charged particle microscope, and apparatus Hiroyasu Shichi, Shinichi Matsubara, Satoshi Tomimatsu, Tomihiro Hashizume, Tohru Ishitani 2012-02-14
7888513 Condensation reaction by metal catalyst Kazushi Mashima, Takanori Iwasaki, Hironori Maeda, Kenya Ishida 2011-02-15