FH

Fwu-Iuan Hshieh

GS General Semiconductor: 44 patents #1 of 38Top 3%
SI Siliconix Incorporated: 33 patents #4 of 125Top 4%
ME Megamos: 16 patents #1 of 9Top 15%
FC Force Mos Technology Co.: 14 patents #2 of 12Top 20%
TS Third Dimension (3D) Semiconductor: 13 patents #1 of 7Top 15%
MS Magepower Semiconductor: 13 patents #1 of 9Top 15%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
AS Alpha And Omega Semiconductor: 1 patents #105 of 159Top 70%
📍 San Jose, CA: #117 of 32,062 inventorsTop 1%
🗺 California: #1,094 of 386,348 inventorsTop 1%
Overall (All Time): #6,999 of 4,157,543Top 1%
142
Patents All Time

Issued Patents All Time

Showing 101–125 of 142 patents

Patent #TitleCo-InventorsDate
5910669 Field effect Trench transistor having lightly doped epitaxial region on the surface portion thereof Mike F. Chang, Sze-Hon Kwan, King Owyang 1999-06-08
5907776 Method of forming a semiconductor structure having reduced threshold voltage and high punch-through tolerance Koon Chong So 1999-05-25
5907169 Self-aligned and process-adjusted high density power transistor with gate sidewalls provided with punch through prevention and reduced JFET resistance True-Lon Lin, Koon Chong So 1999-05-25
5904525 Fabrication of high-density trench DMOS using sidewall spacers Yueh-Se Ho, Bosco Lan, Jowei Dun 1999-05-18
5895951 MOSFET structure and fabrication process implemented by forming deep and narrow doping regions through doping trenches Koon Chong So, Yan Man Tsui, True-Lon Lin, Danny Chi Nim 1999-04-20
5894150 Cell density improvement in planar DMOS with farther-spaced body regions and novel gates 1999-04-13
5883416 Gate-contact structure to prevent contact metal penetration through gate layer without affecting breakdown voltage True-Lon Lin, Koon Chong So, Yan Man Tsui 1999-03-16
5883410 Edge wrap-around protective extension for covering and protecting edges of thick oxide layer Koon Chong So, Danny Chi Nim, Yan Man Tsui 1999-03-16
5877529 Mosfet termination design and core cell configuration to increase breakdown voltage and to improve device ruggedness Koon Chong So, Danny Chi Nim, Yan Man Tsui, True-Lon Lin, Shu-Hui Cheng 1999-03-02
5844277 Power MOSFETs and cell topology True-Lon Lin 1998-12-01
5821583 Trenched DMOS transistor with lightly doped tub Lih-Ying Ching, Hoang H. Tran, Mike F. Chang 1998-10-13
5770503 Method of forming low threshold voltage vertical power transistor using epitaxial technology Hamza Yilmaz, Mike F. Chang 1998-06-23
5767578 Surface mount and flip chip technology with diamond film passivation for total integated circuit isolation Mike F. Chang, King Owyang, Yueh-Se Ho, Jowei Dun, Hans-Jurgen Fusser +1 more 1998-06-16
5763914 Cell topology for power transistors with increased packing density Danny Chi Nim 1998-06-09
5757081 Surface mount and flip chip technology for total integrated circuit isolation Mike F. Chang, King Owyang, Yueh-Se Ho, Jowei Dun 1998-05-26
5753529 Surface mount and flip chip technology for total integrated circuit isolation Mike F. Chang, King Owyang, Yueh-Se Ho, Jowei Dun 1998-05-19
5750416 Method of forming a lateral field effect transistor having reduced drain-to-source on-resistance Mike F. Chang, Jan Van Der Linde, Yueh-Se Ho 1998-05-12
5747853 Semiconductor structure with controlled breakdown protection Koon Chong So, Danny Chi Nim, True-Lon Line, Yan Man Ysui 1998-05-05
5731611 MOSFET transistor cell manufactured with selectively implanted punch through prevent and threshold reductoin zones True-Lon Lin 1998-03-24
5729037 MOSFET structure and fabrication process for decreasing threshold voltage Yan Man Tsui, True-Lon Lin, Danny Chi Nim, Koon Chong So 1998-03-17
5689128 High density trenched DMOS transistor Mike F. Chang, Kuo-In Chen, Richard K. Williams, Mohamed N. Darwish 1997-11-18
5668026 DMOS fabrication process implemented with reduced number of masks True-Lon Lin, Danny Chi Nim, Koon Chong So, Yan Man Tsui 1997-09-16
5639676 Trenched DMOS transistor fabrication having thick termination region oxide Mike F. Chang, Yueh-Se Ho, King Owyang 1997-06-17
5629543 Trenched DMOS transistor with buried layer for reduced on-resistance and ruggedness Mike F. Chang, Lih-Ying Ching, Sze Him Ng, William H. Cook 1997-05-13
5614751 Edge termination structure for power MOSFET Hamza Yilmaz 1997-03-25